MOS Interface Physics, Process and Characterization, Shengkai Wang
Автор: Olaf Stenzel; Miloslav Ohl?dal Название: Optical Characterization of Thin Solid Films ISBN: 331975324X ISBN-13(EAN): 9783319753249 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Описание: This book describes most recent progress in the properties, synthesis, characterization, modelling, and applications of nanomaterials and nanodevices. It begins with the review of the modelling of the structural, electronic and optical properties of low dimensional and nanoscale semiconductors, methodology of synthesis, and characterization of quantum dots and nanowires, with special attention towards Dirac materials, whose electrical conduction and sensing properties far exceed those of silicon-based materials, making them strong competitors. The contributed reviews presented in this book touch on broader issues associated with the environment, as well as energy production and storage, while highlighting important achievements in materials pertinent to the fields of biology and medicine, exhibiting an outstanding confluence of basic physical science with vital human endeavor. The subjects treated in this book are attractive to the broader readership of graduate and advanced undergraduate students in physics, chemistry, biology, and medicine, as well as in electrical, chemical, biological, and mechanical engineering. Seasoned researchers and experts from the semiconductor/device industry also greatly benefit from the book’s treatment of cutting-edge application studies.
Описание: Recent progress in ICT has exceeded our expectations for meeting the requirement of multimedia society in the 21st century. The FSOC is considered to be one of the key technologies for realizing very high speed multi GbPs large-capacity terrestrial and aerospace communications. In FSOC, the optical beam propagation in the turbulent atmosphere is severely affected by various factors suspended in the channel. Wavefront aberration correcting with continuous beam alignment are the key requirements for a successful installation of an FSOC system which are the main contributions in our book. Establishment of FSOC setups, development of accurate weather station, measurement of atmospheric attenuation (Att) and turbulence strength (Cn2), development of new models to predict the Att and Cn2, design of Response Surface Model and Artificial Neural Network based on controller, implementation of neural-controller in FPGA and attaining the BER of 6.4x10^-9 during different outdoor environments. All the original contributions, newness, findings and experimental results etc., are reported in the book. Subject of work; Wireless Optical Communication. The content of the book can be referred by various application designers and/or academicians for working on FSOC transceiver design, laser cutting, laser metrology, laser surgery, beam focusing & pointing, beacon positioning and coupling etc. Further, all necessary MATLAB and VHDL codes are also given on appropriate pages for the readers' quick/ clear understanding.
Автор: Ken-ichi Shudo; Ikufumui Katayama; Shin-Ya Ohno Название: Frontiers in Optical Methods ISBN: 3662507315 ISBN-13(EAN): 9783662507315 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This collection of reviews by leading Japanese researchers covers such topics as ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, and combination of visible and x-ray photonics.
Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.
Автор: Stefan Rein Название: Lifetime Spectroscopy ISBN: 3642064531 ISBN-13(EAN): 9783642064531 Издательство: Springer Рейтинг: Цена: 32651.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.
Автор: Wang, Shengkai Wang, Xiaolei Название: Mos interface physics, process and characterization ISBN: 1032106271 ISBN-13(EAN): 9781032106274 Издательство: Taylor&Francis Рейтинг: Цена: 13014.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit, and is therefore a fundamental building block of the information society. Indeed, high quality MOS structure is the key to achieving high performance devices and integrated circuits. Meanwhile, the control of interface physics, process and characterization methods determine the quality of MOS structure.This book tries to answer five key questions: Why are high-performance integrated circuits bonded together so closely with MOS structure? Which physical phenomena occur in MOS structure? How do these phenomena affect the performance of MOS structure? How can we observe and quantify these phenomena scientifically? How to control the above phenomena through process? Principles are explained based on common experimental phenomena, from sensibility to rationality, via abundant experimental examples focusing on MOS structure, including specific experimental steps with a strong level of operability. This book will be an essential reference for engineers in semiconductor related fields and academics and postgraduates within the field of microelectronics.
Автор: Richard Moser Название: Plastic Tests Plastics ISBN: 3658105291 ISBN-13(EAN): 9783658105297 Издательство: Springer Рейтинг: Цена: 11101.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Richard Moser shows how to use and upgrade toy bricks for the construction of a lightweight, low-cost and easy to reproduce tensile testing setup.
Автор: P. Antognetti; D.A. Antoniadis; Robert W. Dutton; Название: Process and Device Simulation for MOS-VLSI Circuits ISBN: 9400968442 ISBN-13(EAN): 9789400968448 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Study Institute on Process and Device Simulation for MOS-VLSI Circuits, Sogesta, Urbino, Italy, July 12-23, 1982
Описание: The subject of nano-scaled semiconductor devices and technology is a strategic and emerging area of relevant societal importance in our ubiquitous electronics era. This book is intended for those involved in the research, technology development, and societal-related applications where nano-scaled semiconductor devices are involved.
Описание: The World Is Analog.- Review of Single-Crystal Silicon Properties.- PN Junctions.- Rectifying and Ohmic Contacts.- Bipolar and Junction Field-Effect Transistors.- High-Voltage and Power Transistors.- Passive Components.- Process Integration.- Mismatch and Noise.- Chip Reliability.
Автор: R. Freer Название: The Physics and Chemistry of Carbides, Nitrides and Borides ISBN: 9401074445 ISBN-13(EAN): 9789401074445 Издательство: Springer Рейтинг: Цена: 60933.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Research Workshop, Manchester, UK, September 18-22, 1989
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