Описание: Filter Design for System Modeling, State Estimation and Fault Diagnosis analyzes the latest methods in the design of filters for system modeling, state estimation and fault detection with the intention of providing a new perspective of both theoretical and practical aspects.This book also includes fault diagnosis techniques for unknown but bounded systems, their real applications on modeling and fault diagnosis for lithium battery systems, DC-DC converters and spring damping systems. It proposes new methods based on zonotopic Kalman filtering, a variety of state estimation methods of zonotope and its derived algorithms, a state estimation method based on convex space, set inversion interval observer filtering-based guaranteed fault estimation and a novel interval observer filtering-based fault diagnosis. The methods presented in this text are more practical than the common probabilistic-based algorithms, since these can be applied in unknown but bounded noisy environments. This book will be an essential read for students, scholars and engineering professionals who are interested in filter design, system modeling, state estimation, fault diagnosis and related fields.
Описание: With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not only offers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.
Автор: William R. Simpson; John W. Sheppard Название: System Test and Diagnosis ISBN: 146136163X ISBN-13(EAN): 9781461361633 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail.
Описание: This compilation of contributions from experts across the world addresses readers in academia and industry who are concerned with control system design. It covers theoretical topics, applications in various areas as well as software for bond graph modelling.
Автор: Alok Barua Название: Pipelined Analog to Digital Converter and Fault Diagnosis ISBN: 0750317302 ISBN-13(EAN): 9780750317306 Издательство: INGRAM PUBLISHER SERVICES UK Рейтинг: Цена: 25344.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Under what conditions do identity conflicts undermine the legitimacy and power of nation-states, empires, or urban authorities? Does the urban built environment play a role in remedying or exacerbating such conflicts? Employing comparative analysis, these case studies from the Middle East, Europe, and South and Southeast Asia advance our understanding of the origins and nature of urban conflict.
Introduction.- Structural Properties of Bond Graphs for Model-based Control.- Fault Diagnosis.- Failure Prognostic.- Fault Tolerant Control.- Software.- Applications.- Conclusion and Discussion.
Автор: Ye Fangming, Zhang Zhaobo, Chakrabarty Krishnendu Название: Knowledge-Driven Board-Level Functional Fault Diagnosis ISBN: 3319820540 ISBN-13(EAN): 9783319820545 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Introduction.- Diagnosis System Design for Higher Accuracy.- Adaptive Diagnosis Process.- Handling Missing Syndromes.- Information-Theoretic Evaluation of Diagnosis System.- Knowledge Discover and Knowledge Transfer.- Conclusion.
Автор: Vasile Palade; Cosmin Danut Bocaniala Название: Computational Intelligence in Fault Diagnosis ISBN: 1849965838 ISBN-13(EAN): 9781849965835 Издательство: Springer Рейтинг: Цена: 23058.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the most recent concerns and research results in industrial fault diagnosis using intelligent techniques. It focuses on computational intelligence applications to fault diagnosis with real-world applications used in different chapters to validate the different diagnosis methods.
Автор: Ye Название: Knowledge-Driven Board-Level Functional Fault Diagnosis ISBN: 3319402099 ISBN-13(EAN): 9783319402093 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.
• Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;
• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;
• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.
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