Scanning Electron Microscopy and X-Ray Microanalysis, Joseph Goldstein; Dale E. Newbury; Patrick Echlin;
Новое издание
Автор: Joseph Goldstein; Dale Newbury; David Joy; Joseph Название: Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 149396674X ISBN-13(EAN): 9781493966745 Издательство: Springer Цена: 13974.00 р. Наличие на складе: Поставка под заказ. Описание: This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc.
In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling.
New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process.
This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes an online supplement-an extensive "Database of Electron-Solid Interactions"-which can be accessed on SpringerLink, in Chapter 3
Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Автор: Joseph Goldstein; Dale E. Newbury; David C. Joy; C Название: Scanning Electron Microscopy and X-ray Microanalysis ISBN: 1461349699 ISBN-13(EAN): 9781461349693 Издательство: Springer Рейтинг: Цена: 10448.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
Автор: Joseph Goldstein; Dale Newbury; David Joy; Joseph Название: Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 149396674X ISBN-13(EAN): 9781493966745 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Поставка под заказ.
Описание: This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc.
In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling.
New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process.
This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes an online supplement-an extensive "Database of Electron-Solid Interactions"-which can be accessed on SpringerLink, in Chapter 3
The 3rd International Multidisciplinary Microscopy Congress (InterM2015), held from 19 to 23 October 2015, focused on the latest developments concerning applications of microscopy in the biological, physical and chemical sciences at all dimensional scales, advances in instrumentation, techniques in and educational materials on microscopy. These proceedings gather 17 peer-reviewed technical papers submitted by leading academic and research institutions from nine countries and representing some of the most cutting-edge research available.
Автор: E.K. Polychroniadis; Ahmet Yavuz Oral; Mehmet Ozer Название: 2nd International Multidisciplinary Microscopy and Microanalysis Congress ISBN: 3319169181 ISBN-13(EAN): 9783319169187 Издательство: Springer Рейтинг: Цена: 28734.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2nd International Multidisciplinary Microscopy and Microanalysis Congress & Exhibition (InterM 2014) was held on 16-19 October 2014 in Oludeniz, Fethiye/ Mugla, Turkey.The aim of the congress was to gather scientists from various branches and discuss the latest improvements in the field of microscopy.
Автор: Joseph Goldstein; Dale E. Newbury; Patrick Echlin; Название: Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 1461332753 ISBN-13(EAN): 9781461332756 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Patrick Echlin; C.E. Fiori; Joseph Goldstein; Davi Название: Advanced Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 1475790295 ISBN-13(EAN): 9781475790290 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
Автор: E.K. Polychroniadis; Ahmet Yavuz Oral; Mehmet Ozer Название: 2nd International Multidisciplinary Microscopy and Microanalysis Congress ISBN: 3319364405 ISBN-13(EAN): 9783319364407 Издательство: Springer Рейтинг: Цена: 22201.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2nd International Multidisciplinary Microscopy and Microanalysis Congress & Exhibition (InterM 2014) was held on 16-19 October 2014 in Oludeniz, Fethiye/ Mugla, Turkey.The aim of the congress was to gather scientists from various branches and discuss the latest improvements in the field of microscopy.
Автор: Karl Zierold; Herbert K. Hagler Название: Electron Probe Microanalysis ISBN: 3642744796 ISBN-13(EAN): 9783642744792 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Invited contributions with conference discussion of the conference on "Progress of Electron Probe Microanalysis in Biology and Medicine" at Schloss Ringberg, November 16- 19, 1988
Описание: The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at T bingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal- lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. T bingen, August 1969 G. M LLENSTEDT and K. H.
Автор: B.G. Yacobi; L.L. Kazmerski; D.B. Holt Название: Microanalysis of Solids ISBN: 030644433X ISBN-13(EAN): 9780306444333 Издательство: Springer Рейтинг: Цена: 34799.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Describes the most widely used techniques for the microanalysis of the physical, structural, and compositional properties of solids. Covering electron beams, ion beams, photon beams, and acoustic waves, this work provides physicists, materials scientists, electrical engineers, chemists, and their students with a comprehensive reference source.
Автор: Peter Bajcsy; Joe Chalfoun; Mylene Simon Название: Web Microanalysis of Big Image Data ISBN: 3319633597 ISBN-13(EAN): 9783319633596 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Table of Contents. 1
Preface
1 Introduction. 1
1.1 What is image processing pipeline?. 1
1.2 What does web image processing pipeline consist of?. 3
1.3 What are big data microscopy experiments?. 4
1.4 Why are scientists interested in big data microscopy experiments?. 6
1.5 What is the range of applications leveraging image processing pipelines?. 9
1.6 Challenges of big data microscopy experiments. 10
1.7 Tradeoffs before and after digital images are acquired. 12
1.8 Enabling reproducible science from big data microscopy experiments. 14
2 Using Web Image Processing Pipeline for Big Data Microscopy Experiments. 1
2.1 Deploying and Testing the Web Image Processing Pipeline. 2
2.1.1 Types of deployment 4
2.1.2 Deployment of Docker Containers. 6
2.1.3 Deployment recommendations. 7
2.1.4 Test data and computational benchmarks. 8
2.2 Web Image Processing. 10
2.2.1 WIP processing functionality. 10
2.2.2 Examples of WIP usage. 12
2.3 Web Feature Extraction. 15
2.3.1 WFE processing functionality. 17
2.3.2 WFE usage. 19
2.4 Web Statistical Modeling. 21
2.4.1 WSM processing functionality. 23
2.4.2 WSM use case. 24
2.5 Summary. 25
3 Example Use Cases 1
3.1 Cell count and single cell detection. 1
3.1.1 Image processing pipeline. 2
3.1.2 Create a new image collection. 3
3.1.3 Stitching of image tiles. 4
3.1.4 Intensity scaling and pyramid building. 5
3.1.5 Image assembling. 6
3.1.6 Segmentation. 7
3.1.7 Binary image labeling. 8
3.1.8 Feature extraction and single cell detection. 8 3.1.9 Discussion. 9
3.2 Stem cell colony growth computation. 10
3.2.1 Image processing pipeline. 11
3.2.2 Colony tracking and feature extraction
3.2.3 Discussion. 13
3.3 Summary. 15
4 Building Web Image Processing Pipeline for Big Images. 1
4.1 Mapping functionality to information technologies. 1
4.2 The role of each technology in the client-server architecture. 5
4.3 &nbs
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