Описание: This thesis investigates the dielectric properties of metal-oxide ceramics at microwave frequencies. It also demonstrates for the first time that a theory of harmonic phonon coupling can effectively predict the complex permittivity of metal oxides as a function of temperature and frequency. Dielectric ceramics are an important class of materials for radio-frequency, microwave and emergent terahertz technologies. Their key property is complex permittivity, the real part of which permits the miniaturisation of devices and the imaginary part of which is responsible for the absorption of electromagnetic energy. Absorption limits the practical performance of many microwave devices such as filters, oscillators, passive circuits and antennas. Complex permittivity as a function of temperature for low-loss dielectrics is determined by measuring the resonant frequency of dielectric resonators and using the radial mode matching technique to extract the dielectric properties.There have been only a handful of publications on the theory of dielectric loss, and their predictions have often been unfortunately unsatisfactory when compared to measurements of real crystals, sometimes differing by whole orders of magnitude. The main reason for this is the lack of accurate data for a harmonic coupling coefficient and phonon eigenfrequencies at arbitrary q vectors in the Brillouin zone. Here, a quantum field theory of losses in dielectrics is applied, using results from density functional perturbation theory, to predict from first principles the complex permittivity of metal oxides as functions of frequency and temperature.
Автор: Grigoriy I. Torgovnikov Название: Dielectric Properties of Wood and Wood-Based Materials ISBN: 3642774555 ISBN-13(EAN): 9783642774553 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Provided here is a comprehensive treatise on all aspects ofdielectric properties of wood and wood products. - Measurement of dielectric parameters ofwood.- Dielectric properties of oven-dry wood. - Effect of different kinds oftreatment on dielectric properties of wood.
Описание: Advances in synthesis and characterization of dielectric, piezoelectric and ferroelectric thin films are included in this volume. Dielectric, piezoelectric and ferroelectric thin films have a tremendous impact on a variety of commercial and military systems including tunable microwave devices, memories, MEMS devices, actuators and sensors.
Автор: J. Keith Nelson Название: Dielectric Polymer Nanocomposites ISBN: 1441915907 ISBN-13(EAN): 9781441915900 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book discusses the background, principles and promise of nanodielectrics then details the processing of nanocomposites. It also addresses special considerations of clay-based processes and concludes with the perspective of industrial applications.
Автор: Howard Huff; David Gilmer Название: High Dielectric Constant Materials ISBN: 364205921X ISBN-13(EAN): 9783642059216 Издательство: Springer Рейтинг: Цена: 48774.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Issues relating to the high-K gate dielectric are among the greatest challenges for the evolving International Technology Roadmap for Semiconductors (ITRS).
Автор: Paluch Название: Dielectric Properties of Ionic Liquids ISBN: 331932487X ISBN-13(EAN): 9783319324876 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book discusses the mechanisms of electric conductivity in various ionic liquid systems (protic, aprotic as well as polymerized ionic liquids). It hence covers the electric properties of ionic liquids and their macromolecular counterpanes, some of the most promising materials for the development of safe electrolytes in modern electrochemical energy devices such as batteries, super-capacitors, fuel cells and dye-sensitized solar cells. Chapter contributions by the experts in the field discuss important findings obtained using broadband dielectric spectroscopy (BDS) and other complementary techniques. The book is an excellent introduction for readers who are new to the field of dielectric properties of ionic conductors, and a helpful guide for every scientist who wants to investigate the interplay between molecular structure and dynamics in ionic conductors by means of dielectric spectroscopy.
Описание: As semiconductor manufacturers implement copper conductors in advanced interconnect schemes, research and development efforts shift toward the selection of an insulator that can take maximum advantage of the lower power and faster signal propagation allowed by copper interconnects.
Описание: This thesis describes the fabrication of metal-insulator-semiconductor (MIS) structures using very high permittivity dielectrics (based on rare earths) grown by high-pressure sputtering from metallic targets.
Автор: Paul S. Ho; Jihperng Leu; Wei William Lee Название: Low Dielectric Constant Materials for IC Applications ISBN: 3642632211 ISBN-13(EAN): 9783642632211 Издательство: Springer Рейтинг: Цена: 22203.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Low dielectric constant materials are an important component of microelectronic devices. Topics include: Organic dielectric materials, Inorganic dielectric materials, Composite dielectric materials, Metrology and characterization techniques, Integration, Reliability.
Автор: Borja Название: Dielectric Breakdown in Gigascale Electronics ISBN: 3319432184 ISBN-13(EAN): 9783319432182 Издательство: Springer Рейтинг: Цена: 7836.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics. Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation.
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