The Monte Carlo Method for Semiconductor Device Simulation, Carlo Jacoboni; Paolo Lugli

Автор: Carlo Jacoboni; Paolo Lugli
Название: The Monte Carlo Method for Semiconductor Device Simulation
ISBN: 3709174538 ISBN-13(EAN): 9783709174531
Издательство: Springer
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Описание: This volume presents the application of the Monte Carlo method to the simulation of semiconductor devices, reviewing the physics of transport in semiconductors, followed by an introduction to the physics of semiconductor devices.

Автор: Wai Kin Chim
Название: Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
ISBN: 047149240X ISBN-13(EAN): 9780471492405
Издательство: Wiley
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Описание: Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.

Автор: Grasser Tibor, Selberherr Siegfried
Название: Simulation of Semiconductor Processes and Devices 2007 / SISPAD 2007
ISBN: 3211728600 ISBN-13(EAN): 9783211728604
Издательство: Springer
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Цена: 25853.00 р.
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Описание: This volume will contain the proceedings of the 12th edition of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2007), which will take place in Vienna, Austria, on September 25-27, 2007. Like the previous meetings, SISPAD 2007 will provide a world-wide forum for the presentation and discussion of recent advances and developments in the theoretical description, physical modeling and numerical simulation and analysis of semiconductor fabrication processes, device operation and system performance. Topics covered will be device simulation, including transport in nano-structures models of VLSI device scaling limits, quantum effects, and novel devices process simulation, including both continuum and atomistic approaches equipment, topography, and lithography simulation interconnect modeling and algorithms including noise and parasitic effects compact device modeling for circuit simulation integration of circuit and device simulation user interfaces and visualization high performance computing, numerical methods and algorithms mesh generation and adaptation simulation of such devices as microsensor and optoelectronics devices benchmarking, calibration, and verification of simulators.

Автор: Dimitris Tsoukalas; Christos Tsamis
Название: Simulation of Semiconductor Processes and Devices 2001
ISBN: 3709172780 ISBN-13(EAN): 9783709172780
Издательство: Springer
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Описание: This volume contains the Proceedings of the International Conference on Simulation of Semiconductor Devices and Processes, SISPAD 01, held on September 5-7, 2001, in Athens.

Автор: S. Selberherr
Название: Analysis and Simulation of Semiconductor Devices
ISBN: 3709187540 ISBN-13(EAN): 9783709187548
Издательство: Springer
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Цена: 13974.00 р.
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Описание: The invention of semiconductor devices is a fairly recent one, considering classical time scales in human life. Coincident with the growth in semiconductor device development, the literature concerning semiconductor device and technology issues has literally exploded.

Автор: Kristin De Meyer; Serge Biesemans
Название: Simulation of Semiconductor Processes and Devices 1998
ISBN: 3709174155 ISBN-13(EAN): 9783709174159
Издательство: Springer
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Автор: Siegfried Selberherr; Hannes Stippel; Ernst Strass
Название: Simulation of Semiconductor Devices and Processes
ISBN: 3709173728 ISBN-13(EAN): 9783709173725
Издательство: Springer
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Цена: 6986.00 р.
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Описание: With the increasing need for better models and improved understand- ing of physical effects, the Conference on Simulation of Semiconductor Devices and Processes brings together the simulation community and the process- and device en- gineers who need reliable numerical simulation tools for characterization, prediction, and development.

Автор: Heiner Ryssel; Peter Pichler
Название: Simulation of Semiconductor Devices and Processes
ISBN: 3709173639 ISBN-13(EAN): 9783709173633
Издательство: Springer
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Автор: J.S. Yuan; Juin Jei Liou
Название: Semiconductor Device Physics and Simulation
ISBN: 0306457245 ISBN-13(EAN): 9780306457241
Издательство: Springer
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Описание: Provides coverage of modern semiconductor devices - including hetero- and homo-junction devices - using a two-dimensional simulator (MEDICI) to perform the analysis and generate simulation results. It is suitable for device physics to practical device design.

Автор: Enrico Zio
Название: The Monte Carlo Simulation Method for System Reliability and Risk Analysis
ISBN: 1447159012 ISBN-13(EAN): 9781447159018
Издательство: Springer
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Цена: 19589.00 р.
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Описание: This book illustrates the Monte Carlo simulation method and its application to reliability and system engineering. Conveys a sound understanding of of the fundamentals of Monte Carlo sampling and simulation and its application for realistic system modeling.

Автор: Rubinstein Reuven Y.
Название: Simulation and the Monte Carlo Method
ISBN: 1118632168 ISBN-13(EAN): 9781118632161
Издательство: Wiley
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Цена: 17416.00 р.
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Описание: Simulation and the Monte Carlo Method, Third Edition reflects the latest developments in the field and presents a fully updated and comprehensive account of the major topics that have emerged in Monte Carlo simulation since the publication of the classic First Edition over more than a quarter of a century ago.

Автор: Karl Hess
Название: Monte Carlo Device Simulation
ISBN: 0792391721 ISBN-13(EAN): 9780792391722
Издательство: Springer
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Описание: Monte Carlo simulation is now a well established method for studying semiconductor devices and is particularly well suited to highlighting physical mechanisms and exploring material properties.