Light Scattering and Nanoscale Surface Roughness, Alexei A. Maradudin
Автор: Maradudin Название: Light Scattering and Nanoscale Surface Roughness ISBN: 038725580X ISBN-13(EAN): 9780387255804 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers both experimental and theoretical aspects of nanoscale light scattering and surface roughness.Topics include: Spherical particles located on a substrate, surface and buried interface roughness, surface roughness of polymer thin films, magnetic and thermal fluctuations at planar surfaces, speckle patterns, scattering of electromagnetic waves from a metal, multiple wavelength light scattering, nanoroughness standards, Beckmann-Kirchoff scalar scattering theory, random and nonrandom (patterned) surfaces, surface plasmons, instrumentation and experimental methods.
Описание: This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations.
Автор: Y. Watanabe; S. Heun; G. Salviati; N. Yamamoto Название: Nanoscale Spectroscopy and Its Applications to Semiconductor Research ISBN: 3662143720 ISBN-13(EAN): 9783662143728 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Andrei Benediktovich; Ilya Feranchuk; Alexander Ul Название: Theoretical Concepts of X-Ray Nanoscale Analysis ISBN: 3642381766 ISBN-13(EAN): 9783642381768 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.
Автор: Chagaan Baatar; Wolfgang Porod; Tamas Roska Название: Cellular Nanoscale Sensory Wave Computing ISBN: 1441910107 ISBN-13(EAN): 9781441910103 Издательство: Springer Рейтинг: Цена: 22203.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This fresh perspective of sensory computing successfully bridges the gap between nanoscale devices and CMOS integrated circuits. Practical and complex algorithms are also discussed, in addition to new developments like the nanoscale antenna.
Автор: Tinker-Mill Название: Nanoscale Imaging and Characterisation of Amyloid-? ISBN: 3319395335 ISBN-13(EAN): 9783319395333 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This thesis presents a method for reliably and robustly producing samples of amyloid-? (A?) by capturing them at various stages of aggregation, as well as the results of subsequent imaging with various atomic force microscopy (AFM) methods, all of which add value to the data gathered by collecting information on the peptide’s nanomechanical, elastic, thermal or spectroscopical properties.
Amyloid-? (A?) undergoes a hierarchy of aggregation following a structural transition, making it an ideal subject of study using scanning probe microscopy (SPM), dynamic light scattering (DLS) and other physical techniques. By imaging samples of A? with Ultrasonic Force Microscopy, a detailed substructure to the morphology is revealed, which correlates well with the most advanced cryo-EM work. Early stage work in the area of thermal and spectroscopical AFM is also presented, and indicates the promise these techniques may hold for imaging sensitive and complex biological materials. This thesis demonstrates that physical techniques can be highly complementary when studying the aggregation of amyloid peptides, and allow the detection of subtle differences in their aggregation processes.
Автор: A.-P. Jauho; Eugenia V. Buzaneva Название: Frontiers in Nanoscale Science of Micron/Submicron Devices ISBN: 9401072949 ISBN-13(EAN): 9789401072946 Издательство: Springer Рейтинг: Цена: 51290.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Study Institute, Kiev, Ukraine, August 16-26, 1995
Автор: Terry L. Alford; L.C. Feldman; James W. Mayer Название: Fundamentals of Nanoscale Film Analysis ISBN: 1441939806 ISBN-13(EAN): 9781441939807 Издательство: Springer Рейтинг: Цена: 11099.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. From thin films to field effect transistors, the emphasis is on reducing dimensions from the micro to the nanoscale. Fundamentals of NanoscaleFilm Analysis concentrates on analysis of the structure and composition of the surface and the outer few tens to hundred nanometers in depth. It describes characterization techniques to quantify the structure, composition and depth distribution of materials with the use of energetic particles and photons.
The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures. These induced reactions lead to the emission of a variety of detected of particles and photons. It is the energy and intensity of the detected beams that is the basis of the characterization of the materials. The array of experimental techniques used in nanoscale materials analysis covers a wide range of incident particle and detected beam interactions.
Included are such important interactions as atomic collisions, Rutherford backscattering, ion channeling, diffraction, photon absorption, radiative and nonradiative transitions, and nuclear reactions. A variety of analytical and scanning probe microscopy techniques are presented in detail.
Автор: Mark Lundstrom; Jing Guo Название: Nanoscale Transistors ISBN: 1441939156 ISBN-13(EAN): 9781441939159 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: To push MOSFETs to their scaling limits and to explore devices that may complement or even replace them at molecular scale, a clear understanding of device physics at nanometer scale is necessary.
Автор: Andrei Benediktovich; Ilya Feranchuk; Alexander Ul Название: Theoretical Concepts of X-Ray Nanoscale Analysis ISBN: 3662520540 ISBN-13(EAN): 9783662520543 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.
Автор: Chagaan Baatar; Wolfgang Porod; Tamas Roska Название: Cellular Nanoscale Sensory Wave Computing ISBN: 1489984534 ISBN-13(EAN): 9781489984531 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This fresh perspective of sensory computing successfully bridges the gap between nanoscale devices and CMOS integrated circuits. Practical and complex algorithms are also discussed, in addition to new developments like the nanoscale antenna.
Автор: Jordan A. Hachtel Название: The Nanoscale Optical Properties of Complex Nanostructures ISBN: 3319702580 ISBN-13(EAN): 9783319702582 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Furthermore, there is a focus in the dissertation on the combination of distinct techniques to study the difficult-to-access aspects of the nanoscale response of complex nanostructures: the combination of complementary spectroscopies, the combination of electron microscopy and photonics, and the combination of experiment and theory.
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