Fundamentals of Electromigration-Aware Integrated Circuit Design, Jens Lienig; Matthias Thiele
Автор: Ahmed Abdelgawad; Magdy Bayoumi Название: Resource-Aware Data Fusion Algorithms for Wireless Sensor Networks ISBN: 1489987061 ISBN-13(EAN): 9781489987068 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book introduces resource-aware data fusion algorithms that generate inferences by combining data from multiple sources-techniques useful in centralized and distributed systems to overcome sensor failure, technological limitations, and coverage problems.
Автор: Cher Ming Tan; Feifei He Название: Electromigration Modeling at Circuit Layout Level ISBN: 9814451207 ISBN-13(EAN): 9789814451208 Издательство: Springer Рейтинг: Цена: 9141.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.
Автор: Posser Название: Electromigration Inside Logic Cells ISBN: 3319488988 ISBN-13(EAN): 9783319488981 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.
Автор: Tan Cher Ming Название: Electromigration In Ulsi Interconnections ISBN: 9814273325 ISBN-13(EAN): 9789814273329 Издательство: World Scientific Publishing Рейтинг: Цена: 15840.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.
Описание: Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. Electromigration in thin films and electronic devices provides an up-to-date review of key topics in this commercially important area.Part one consists of three introductory chapters, covering modelling of electromigration phenomena, modelling electromigration using the peridynamics approach and simulation and x-ray microbeam studies of electromigration. Part two deals with electromigration issues in copper interconnects, including x-ray microbeam analysis, voiding, microstructural evolution and electromigration failure. Finally, part three covers electromigration in solder, with chapters discussing topics such as electromigration-induced microstructural evolution and electromigration in flip-chip solder joints.With its distinguished editor and international team of contributors, Electromigration in thin films and electronic devices is an essential reference for materials scientists and engineers in the microelectronics, packaging and interconnects industries, as well as all those with an academic research interest in the field.
Описание: This book offers a technology-oriented assessment of analog and mixed-signal circuits in emerging high-k and multi-gate CMOS technologies. Coverage includes transient threshold voltage variations and integration of tunnel transistors in a multi-gage process.
Автор: Massoud Pedram; Jan M. Rabaey Название: Power Aware Design Methodologies ISBN: 1475785135 ISBN-13(EAN): 9781475785135 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Power Aware Design Methodologies is on power-awareness in design. The difference between low-power design and power-awareness in design is that whereas low-power design refers to minimizing power with or without a performance constraint, power-aware design refers to maximizing some other performance metric, subject to a power budget (even while reducing power dissipation).
Power Aware Design Methodologies was conceived as an effort to bring all aspects of power-aware design methodologies together in a single document. It covers several layers of the design hierarchy from technology, circuit logic, and architectural levels up to the system layer. It includes discussion of techniques and methodologies for improving the power efficiency of CMOS circuits (digital and analog), systems on chip, microelectronic systems, wirelessly networked systems of computational nodes and so on. In addition to providing an in-depth analysis of the sources of power dissipation in VLSI circuits and systems and the technology and design trends, this book provides a myriad of state-of-the-art approaches to power optimization and control.
The different chapters of Power Aware Design Methodologies have been written by leading researchers and experts in their respective areas. Contributions are from both academia and industry. The contributors have reported the various technologies, methodologies, and techniques in such a way that they are understandable and useful to the circuit and system designers, tool developers, and academic researchers and students.
Power Aware Design Methodologies is written for the design professional and can be used as a textbook for an advanced course on power-aware design methodologies.
Описание: Addressing the rising security issues during the design stages of cyber-physical systems, this book develops a systematic approach to address security at early design stages together with all other design constraints.
Описание: This book presents fresh research techniques, algorithms, methodologies and experimental results for high-level power estimation and power-aware high-level synthesis. The book will help get products to market quicker and facilitate low-power ASIC/FPGA design.
Автор: Progyna Khondkar Название: Low-Power Design and Power-Aware Verification ISBN: 3319882864 ISBN-13(EAN): 9783319882864 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Поставка под заказ.
Описание: Until now, there has been a lack of a complete knowledge base to fully comprehend Low power (LP) design and power aware (PA) verification techniques and methodologies and deploy them all together in a real design verification and implementation project. This book is a first approach to establishing a comprehensive PA knowledge base.LP design, PA verification, and Unified Power Format (UPF) or IEEE-1801 power format standards are no longer special features. These technologies and methodologies are now part of industry-standard design, verification, and implementation flows (DVIF). Almost every chip design today incorporates some kind of low power technique either through power management on chip, by dividing the design into different voltage areas and controlling the voltages, through PA dynamic and PA static verification, or their combination.The entire LP design and PA verification process involves thousands of techniques, tools, and methodologies, employed from the register transfer level (RTL) of design abstraction down to the synthesis or place-and-route levels of physical design. These techniques, tools, and methodologies are evolving everyday through the progression of design-verification complexity and more intelligent ways of handling that complexity by engineers, researchers, and corporate engineering policy makers.
Автор: Progyna Khondkar Название: Low-Power Design and Power-Aware Verification ISBN: 3319666185 ISBN-13(EAN): 9783319666181 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Until now, there has been a lack of a complete knowledge base to fully comprehend Low power (LP) design and power aware (PA) verification techniques and methodologies and deploy them all together in a real design verification and implementation project. This book is a first approach to establishing a comprehensive PA knowledge base.LP design, PA verification, and Unified Power Format (UPF) or IEEE-1801 power format standards are no longer special features. These technologies and methodologies are now part of industry-standard design, verification, and implementation flows (DVIF). Almost every chip design today incorporates some kind of low power technique either through power management on chip, by dividing the design into different voltage areas and controlling the voltages, through PA dynamic and PA static verification, or their combination.The entire LP design and PA verification process involves thousands of techniques, tools, and methodologies, employed from the register transfer level (RTL) of design abstraction down to the synthesis or place-and-route levels of physical design. These techniques, tools, and methodologies are evolving everyday through the progression of design-verification complexity and more intelligent ways of handling that complexity by engineers, researchers, and corporate engineering policy makers.
Автор: Chung-Wei Lin; Alberto Sangiovanni-Vincentelli Название: Security-Aware Design for Cyber-Physical Systems ISBN: 3319513273 ISBN-13(EAN): 9783319513270 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Addressing the rising security issues during the design stages of cyber-physical systems, this book develops a systematic approach to address security at early design stages together with all other design constraints.
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