Springer Handbook of Microscopy, Peter W. Hawkes; John C.H. Spence
Автор: Zewail, Ahmed H. Thomas, John M. Название: 4d electron microscopy ISBN: 1848163908 ISBN-13(EAN): 9781848163904 Издательство: World Scientific Publishing Рейтинг: Цена: 12751.00 р. 18216.00-30% Наличие на складе: Есть (2 шт.) Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.
Автор: Joseph Goldstein; Dale Newbury; David Joy; Joseph Название: Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 149396674X ISBN-13(EAN): 9781493966745 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Поставка под заказ.
Описание: This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc.
In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling.
New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process.
This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes an online supplement-an extensive "Database of Electron-Solid Interactions"-which can be accessed on SpringerLink, in Chapter 3
Автор: Udo J. Birk Название: Super-Resolution Microscopy - A Practical Guide ISBN: 3527341331 ISBN-13(EAN): 9783527341337 Издательство: Wiley Рейтинг: Цена: 15674.00 р. Наличие на складе: Поставка под заказ.
Описание: This unique book on super-resolution microscopy techniques presents comparative, in-depth analyses of the strengths and weaknesses of the individual approaches.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 ISBN: 3662506017 ISBN-13(EAN): 9783662506011 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
Автор: Bunsell, A. R. Название: Handbook of Properties of Textile and Technical Fibres ISBN: 0081012721 ISBN-13(EAN): 9780081012727 Издательство: Elsevier Science Рейтинг: Цена: 43792.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Handbook of Properties of Textile and Technical Fibres, Second Edition introduces tensile properties and failure and testing of fibers, also examining tensile properties and the failure of natural fibers, such as cotton, hemp, flax, agave, wool and silk. Next, the book discusses the tensile properties and failure of synthetic fibers, ranging from polyamide, polyester, polyethylene and carbon fibers. Chapters provide a general background of the fiber, including its manufacture, microstructure, factors that affect tensile properties and methods to improve tensile failure. With its distinguished editor and international contributors, this book is an important reference for fiber scientists, textile technologists, engineers and academics.
Offers up-to-date coverage of new and advanced materials for the fiber and textile industries
Reviews structure-property relationships of high-performance natural, synthetic polymer and inorganic fibers
Offers a range of perspectives on the tensile properties of fibers from an international team of authors with diverse expertise in academic research and in textile development and manufacture
Автор: Hellier Chuck Название: Handbook of Nondestructive Evaluation ISBN: 0071777148 ISBN-13(EAN): 9780071777148 Издательство: McGraw-Hill Рейтинг: Цена: 20075.00 р. Наличие на складе: Поставка под заказ.
Описание: This book presents a detailed, up-to-date discussion of today`s most commonly used and emerging methods of nondestructive testing-including background, explanation, benefits, limitations, applications, and comparisons to destructive testing.
Автор: Zhong Lin Wang, Nan Yao Название: Handbook of microscopy for nanotechnology ISBN: 1402080034 ISBN-13(EAN): 9781402080036 Издательство: Springer Рейтинг: Цена: 34937.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Автор: Michler G.H. Название: Electron Microscopy of Polymers ISBN: 3540363505 ISBN-13(EAN): 9783540363507 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Автор: Page Lisa Название: Handbook of Transmission Electron Microscopy ISBN: 1632382830 ISBN-13(EAN): 9781632382832 Издательство: Неизвестно Цена: 28506.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Название: Sample Preparation Handbook for Transmission Electron Microscopy ISBN: 1489998853 ISBN-13(EAN): 9781489998859 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis.
Описание: This best-selling undergraduate textbook introduces the key experimental techniques from across the biosciences. It uniquely integrates the theories and methods driving the fields of biology and medicine, comprehensively covering both the techniques that students will encounter in lab classes and those that underpin recent advances and discoveries.
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