A Practical Guide to Surface Metrology, Quinten Michael
Автор: Michael Quinten Название: A Practical Guide to Surface Metrology ISBN: 3030294536 ISBN-13(EAN): 9783030294533 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).The book provides:Overview of the working principlesDescription of advantages and disadvantagesCurrently achievable numbers for resolutions, repeatability, and reproducibilityExamples of real-world applicationsA final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization ofsurfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.
Автор: Richard Leach Название: Advances in Optical Form and Coordinate Metrology ISBN: 0750325224 ISBN-13(EAN): 9780750325226 Издательство: INGRAM PUBLISHER SERVICES UK Рейтинг: Цена: 25344.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Many recent studies argue that domestic factors such as corruption, nepotism, and Confucian traditions of government and society prevented the industrial enterprises initiated by China from 1870 to 1911 from achieving success. Dr. Thomas takes a different view, showing that foreign intervention had more influence than purely domestic concerns on the nation`s industrialization efforts.
Автор: Krishnan, Kannan M. Название: Principles of Materials Characterization and Metrology ISBN: 0198830262 ISBN-13(EAN): 9780198830269 Издательство: Oxford Academ Рейтинг: Цена: 7047.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.
Описание: This book provides insights into surface quality control techniques and applications based on high-definition metrology (HDM). Intended as a reference resource for engineers who routinely use a variety of quality control methods and are interested in understanding the data processing, from HDM data to final control actions, it can also be used as a textbook for advanced courses in engineering quality control applications for students who are already familiar with quality control methods and practices. It enables readers to not only assimilate the quality control methods involved, but also to quickly implement the techniques in practical engineering problems. Further, it includes numerous case studies to highlight the implementation of the methods using measured HDM data of surface features. Since MATLAB is extensively employed in these case studies, familiarity with this software is helpful, as is a general understanding of surface quality control methods.
Автор: Balasubramanian Muralikrishnan; Jayaraman Raja Название: Computational Surface and Roundness Metrology ISBN: 1849967733 ISBN-13(EAN): 9781849967730 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. There are examples, illustrations and exercises included.
Автор: Gupta S. V. Название: Mass Metrology: The Newly Defined Kilogram ISBN: 3030124673 ISBN-13(EAN): 9783030124670 Издательство: Springer Рейтинг: Цена: 22359.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck`s constant.
Автор: Simon David S., Jaeger Gregg, Sergienko Alexander V. Название: Quantum Metrology, Imaging, and Communication ISBN: 3319835408 ISBN-13(EAN): 9783319835402 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Автор: Grabe Michael Название: Truth and Traceability in Physics and Metrology ISBN: 1643270982 ISBN-13(EAN): 9781643270982 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 3762.00 р. Наличие на складе: Нет в наличии.
Автор: Wei Gao Название: Metrology ISBN: 9811049386 ISBN-13(EAN): 9789811049385 Издательство: Springer Рейтинг: Цена: 55901.00 р. Наличие на складе: Нет в наличии.
Описание: The aim of this handbook is to provide a comprehensive summary of sensing and measurement in precision manufacturing, which is essential for process and quality control. The importance of precision sensing and measurements lies not only in the ability to distinguish whether the manufactured part meets the assigned tolerances through inspection but also, in many cases, reduce the deviation of the manufactured part from the designed values through improvement of the process or compensation manufacturing based on the sensing and measurement results. The information provided in the book will be of interest to industrial practitioners and researchers in the field of precision manufacturing sensing and measurements.
This volume is part of a handbook series that covers a comprehensive range of scientific and technological matters in ‘Precision Manufacturing’.
Автор: Aswal Dinesh K. Название: Metrology for Inclusive Growth of India ISBN: 9811588716 ISBN-13(EAN): 9789811588716 Издательство: Springer Цена: 20962.00 р. Наличие на складе: Нет в наличии.
Описание: This book describes the significance of metrology for inclusive growth in India and explains its application in the areas of physical-mechanical engineering, electrical and electronics, Indian standard time measurements, electromagnetic radiation, environment, biomedical, materials and Bhartiya Nirdeshak Dravyas (BND (R)).
Автор: Bulska Ewa Название: Metrology in Chemistry ISBN: 3030075761 ISBN-13(EAN): 9783030075767 Издательство: Springer Рейтинг: Цена: 11878.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics - such as traceability, calibration, chemical reference materials, validation and uncertainty - are covered.
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