Автор: Dimitry N. Frolov Название: Microscope Design: Volume 1: Principles ISBN: 1510639934 ISBN-13(EAN): 9781510639935 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 13814.00 р. Наличие на складе: Нет в наличии.
Описание: Traces the historical development of microscopy instruments from their invention to the current state of the art. New concepts and engineering solutions are presented for modern light microscopes, with a focus on the practical construction of optical systems. Real design parameters of dioptric objectives and other systems are provided.
Автор: Hiroyasu Saka Название: Practical Electron Microscopy Of Lattice Defects ISBN: 9811234698 ISBN-13(EAN): 9789811234699 Издательство: World Scientific Publishing Рейтинг: Цена: 15840.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: 'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]
Ultramicroscopy
This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Автор: Bonnell Dawn A Название: Scanning Probe Microscopy for Energy Research ISBN: 9814434701 ISBN-13(EAN): 9789814434706 Издательство: World Scientific Publishing Рейтинг: Цена: 31680.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
Описание: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.
Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Автор: Liu, Jian Tan, Jiubin Название: Confocal microscopy ISBN: 1681743361 ISBN-13(EAN): 9781681743363 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 6237.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.
Автор: Camastra Francesco Название: Machine Learning for Audio, Image and Video Analysis ISBN: 1447167341 ISBN-13(EAN): 9781447167341 Издательство: Springer Рейтинг: Цена: 11878.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book illustrates how to deal with complex media and convert raw data into useful information. Students and researchers needing a solid foundation or reference, and practitioners interested in discovering more about the state-of-the-art will find this book invaluable.
Автор: Merchant, Fatima Название: Microscope Image Processing ISBN: 0128210494 ISBN-13(EAN): 9780128210499 Издательство: Elsevier Science Рейтинг: Цена: 20043.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Microscope Image Processing, Second Edition, introduces the basic fundamentals of image formation in microscopy including the importance of image digitization and display, which are key to quality visualization. Image processing and analysis are discussed in detail to provide readers with the tools necessary to improve the visual quality of images, and to extract quantitative information. Basic techniques such as image enhancement, filtering, segmentation, object measurement, and pattern recognition cover concepts integral to image processing. In addition, chapters on specific modern microscopy techniques such as fluorescence imaging, multispectral imaging, three-dimensional imaging and time-lapse imaging, introduce these key areas with emphasis on the differences among the various techniques.
The new edition discusses recent developments in microscopy such as light sheet microscopy, digital microscopy, whole slide imaging, and the use of deep learning techniques for image segmentation and analysis with big data image informatics and management.
Microscope Image Processing, Second Edition, is suitable for engineers, scientists, clinicians, post-graduate fellows and graduate students working in bioengineering, biomedical engineering, biology, medicine, chemistry, pharmacology and related fields, who use microscopes in their work and would like to understand the methodologies and capabilities of the latest digital image processing techniques or desire to develop their own image processing algorithms and software for specific applications.
Автор: P. W. Hawkes; J. Frank; P.W. Hawkes; R. Hegerl; W. Название: Computer Processing of Electron Microscope Images ISBN: 3642813836 ISBN-13(EAN): 9783642813832 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper- imental difficulty;
Автор: Champness, P.E. Название: Electron Diffraction in the Transmission Electron Microscope ISBN: 1859961479 ISBN-13(EAN): 9781859961476 Издательство: Taylor&Francis Рейтинг: Цена: 11482.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Bell, DC Название: Energy Dispersive X-ray Analysis in the Electron Microscope ISBN: 1859961096 ISBN-13(EAN): 9781859961094 Издательство: Taylor&Francis Рейтинг: Цена: 17609.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Schattschneider, Peter Название: Linear and Chiral Dichroism in the Electron Microscope ISBN: 9814267481 ISBN-13(EAN): 9789814267489 Издательство: Taylor&Francis Рейтинг: Цена: 17609.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
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