Topics in Electron Diffraction and Microscopy of Materials, Hirsch, Peter. B
Автор: Eric J. Mittemeijer; Paolo Scardi Название: Diffraction Analysis of the Microstructure of Materials ISBN: 3642073522 ISBN-13(EAN): 9783642073526 Издательство: Springer Рейтинг: Цена: 32651.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Overview of diffraction methods applied to the analysis of the microstructure of materials.
Описание: The structure–property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author’s course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.
Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Автор: Henning Friis Poulsen Название: Three-Dimensional X-Ray Diffraction Microscopy ISBN: 366214543X ISBN-13(EAN): 9783662145432 Издательство: Springer Рейтинг: Цена: 22359.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Описание: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction.
Автор: De Graef Название: Structure of Materials ISBN: 1107005876 ISBN-13(EAN): 9781107005877 Издательство: Cambridge Academ Рейтинг: Цена: 9978.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The new edition of this highly readable, popular textbook covers the fundamentals of crystallography, symmetry and diffraction and applies these concepts to a large range of materials. Now with new end-of-chapter exercises, more illustrations, more streamlined coverage of crystallography and additional coverage of magnetic point group symmetry.
Автор: Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda Название: X-Ray Diffraction Crystallography ISBN: 3642442552 ISBN-13(EAN): 9783642442551 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.
Автор: Tsirelson, V.G Название: Electron Density and Bonding in Crystals ISBN: 0750302844 ISBN-13(EAN): 9780750302845 Издательство: Taylor&Francis Рейтинг: Цена: 38280.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Champness, P.E. Название: Electron Diffraction in the Transmission Electron Microscope ISBN: 1859961479 ISBN-13(EAN): 9781859961476 Издательство: Taylor&Francis Рейтинг: Цена: 11482.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: P. Goodman Название: Fifty Years of Electron Diffraction ISBN: 9027712468 ISBN-13(EAN): 9789027712462 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
