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Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects, Morniroli, Jean- Paul


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Автор: Morniroli, Jean- Paul
Название:  Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects
ISBN: 9782901483052
Издательство: Taylor&Francis
Классификация:
ISBN-10: 2901483054
Обложка/Формат: Paperback
Страницы: 376
Вес: 0.62 кг.
Дата издания: 01.11.2004
Язык: English
Размер: 233 x 168 x 26
Читательская аудитория: Postgraduate, research & scholarly
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Поставляется из: Европейский союз


Electron Density and Bonding in Crystals

Автор: Tsirelson, V.G
Название: Electron Density and Bonding in Crystals
ISBN: 0750302844 ISBN-13(EAN): 9780750302845
Издательство: Taylor&Francis
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Цена: 38280.00 р.
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Fundamentals of crystallography, powder x-ray diffraction, and transmission electron microscopy for materials scientists

Автор: Zhili, Dong (nanyang Technological University, Singapore)
Название: Fundamentals of crystallography, powder x-ray diffraction, and transmission electron microscopy for materials scientists
ISBN: 0367357941 ISBN-13(EAN): 9780367357948
Издательство: Taylor&Francis
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Цена: 17609.00 р.
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Описание: The structure–property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author’s course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.

Topics in Electron Diffraction and Microscopy of Materials

Автор: Hirsch, Peter. B
Название: Topics in Electron Diffraction and Microscopy of Materials
ISBN: 075030538X ISBN-13(EAN): 9780750305389
Издательство: Taylor&Francis
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Цена: 25265.00 р.
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Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
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Цена: 19591.00 р.
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Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

Physics of Elasticity and Crystal Defects

Автор: Sutton Adrian P.
Название: Physics of Elasticity and Crystal Defects
ISBN: 0198860781 ISBN-13(EAN): 9780198860785
Издательство: Oxford Academ
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Цена: 16380.00 р.
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Описание: Although linear elasticity of defects in solids is well established, this textbook introduces the subject in a novel way by comparing key concepts at the atomic scale and at the usual continuum scale, and it explores the relationships between these treatments. There are exercises to work through, with solutions for instructors from the OUP website.

X-Ray Diffraction, A Practical Approach

Автор: Suryanarayana, C., Norton, M. Grant
Название: X-Ray Diffraction, A Practical Approach
ISBN: 030645744X ISBN-13(EAN): 9780306457449
Издательство: Springer
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Цена: 20962.00 р.
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Описание: Combining both theoretical and practical aspects of x-ray diffraction, this book emphasizes a `hands on` approach through experiments and examples based on actual laboratory data. It presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.

X-Ray Multiple-Wave Diffraction

Автор: Shih-Lin Chang
Название: X-Ray Multiple-Wave Diffraction
ISBN: 3642059473 ISBN-13(EAN): 9783642059476
Издательство: Springer
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Цена: 26120.00 р.
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Описание: X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two- or higher-dimensional structures, like 2-d and 3-d crystals and even quasi- crystals.

Low-Temperature X-Ray Diffraction

Автор: Reuben Rudman
Название: Low-Temperature X-Ray Diffraction
ISBN: 1461587735 ISBN-13(EAN): 9781461587736
Издательство: Springer
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Цена: 14365.00 р.
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Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.

The Basics of Crystallography and Diffraction

Автор: Hammond, Christopher
Название: The Basics of Crystallography and Diffraction
ISBN: 0198738684 ISBN-13(EAN): 9780198738688
Издательство: Oxford Academ
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Цена: 8078.00 р.
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Описание: Crystallography and diffraction are widely used throughout science for studying structure. The aim of this book is to show, through relevant examples and without relying on complex mathematics, that the basic ideas behind crystallography and diffraction are simple and easily comprehensible.

Crystallography and crystal defects

Автор: Kelly, A. Groves, G.w. Kidd, P. (queen Mary And We
Название: Crystallography and crystal defects
ISBN: 0471720445 ISBN-13(EAN): 9780471720447
Издательство: Wiley
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Цена: 14256.00 р.
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Описание: The study of form and structure of crystals is multidisciplinary and therefore important in the study of physics, chemistry, molecular biology, materials science and mineralogy. This book combines aspects of crystallography, solid state physics and engineering.

Fifty Years of Electron Diffraction

Автор: P. Goodman
Название: Fifty Years of Electron Diffraction
ISBN: 9027712468 ISBN-13(EAN): 9789027712462
Издательство: Springer
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Цена: 20896.00 р.
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Structure of Materials

Автор: De Graef
Название: Structure of Materials
ISBN: 1107005876 ISBN-13(EAN): 9781107005877
Издательство: Cambridge Academ
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Цена: 9978.00 р.
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Описание: The new edition of this highly readable, popular textbook covers the fundamentals of crystallography, symmetry and diffraction and applies these concepts to a large range of materials. Now with new end-of-chapter exercises, more illustrations, more streamlined coverage of crystallography and additional coverage of magnetic point group symmetry.


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