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Coherent Electron Microscopy: Designing Faster And Brighter Electron Sources,227, Hawkes,Peter W.


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Автор: Hawkes,Peter W.
Название:  Coherent Electron Microscopy: Designing Faster And Brighter Electron Sources,227
ISBN: 9780443193248
Издательство: Elsevier Science
Классификация:



ISBN-10: 044319324X
Обложка/Формат: Hardback
Страницы: 250
Вес: 0.45 кг.
Дата издания: 15.08.2023
Размер: 229 x 151
Основная тема: Serial product
Ссылка на Издательство: Link
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Поставляется из: Европейский союз


4d electron microscopy

Автор: Zewail, Ahmed H. Thomas, John M.
Название: 4d electron microscopy
ISBN: 1848163908 ISBN-13(EAN): 9781848163904
Издательство: World Scientific Publishing
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Цена: 12751.00 р. 18216.00 -30%
Наличие на складе: Есть (2 шт.)
Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.

Correlative Light and Electron Microscopy III

Автор: Muller-Reichert, Thomas
Название: Correlative Light and Electron Microscopy III
ISBN: 0128099755 ISBN-13(EAN): 9780128099759
Издательство: Elsevier Science
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Цена: 21222.00 р.
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Описание:

Correlative Light and Electron Microscopy III, Volume 140, a new volume in the Methods in Cell Biology, series continues the legacy of this premier serial with quality chapters authored by leaders in the field.

This is the third volume of Methods in Cell Biology covering current Correlative Light and Electron Microscopy (CLEM) methodologies. The field of CLEM is still growing and new combinations of imaging technologies provide exciting new insights. The chapters deal with different approaches to analyze the same specimen by more than one imaging technique to gain more and/or better information over applying each imaging technique separately. The strengths and application area of each presented CLEM approach are highlighted.

This volume explores the aspects of sample preparation of diverse biological systemsfor different CLEM approaches and will serve as a valuable resource to researchers in the field of cell biology.


  • Contains contributions from experts in the field
  • Covered topics include targeted ultramicrotomy and high-precision correlation
  • Presents recent advances and currently applied correlative approaches
  • Gives detailed protocols allowing the application of workflows in one's own laboratory setting
  • Covers CLEM approaches in the context of specific applications
  • Aims to stimulate the use of new combinations of imaging modalities
Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Автор: Rodenburg, John M.
Название: Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997
ISBN: 0750304413 ISBN-13(EAN): 9780750304412
Издательство: Taylor&Francis
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Цена: 22968.00 р.
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Cellular Electron Microscopy

Автор: McIntosh, J. Richard
Название: Cellular Electron Microscopy
ISBN: 0123706475 ISBN-13(EAN): 9780123706478
Издательство: Elsevier Science
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Цена: 19370.00 р.
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Introduction to Scanning Transmission Electron Microscopy

Автор: Keyse, Dr Robert
Название: Introduction to Scanning Transmission Electron Microscopy
ISBN: 1859960669 ISBN-13(EAN): 9781859960660
Издательство: Taylor&Francis
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Цена: 12248.00 р.
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In-Situ Transmission Electron Microscopy

Автор: Sun
Название: In-Situ Transmission Electron Microscopy
ISBN: 9811968446 ISBN-13(EAN): 9789811968440
Издательство: Springer
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Цена: 22359.00 р.
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Описание: This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.

Scanning Electron Microscopy

Автор: Page Lisa
Название: Scanning Electron Microscopy
ISBN: 163238406X ISBN-13(EAN): 9781632384065
Издательство: Неизвестно
Цена: 22990.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.

Coherent Raman Scattering Microscopy

Название: Coherent Raman Scattering Microscopy
ISBN: 1138199524 ISBN-13(EAN): 9781138199521
Издательство: Taylor&Francis
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Цена: 11482.00 р.
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Quantitative Atomic-Resolution Electron Microscopy, 217

Автор: Hÿtch Martin, Hawkes Peter W.
Название: Quantitative Atomic-Resolution Electron Microscopy, 217
ISBN: 0128246073 ISBN-13(EAN): 9780128246078
Издательство: Elsevier Science
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Цена: 28465.00 р.
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Описание: Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting, Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Digital Holographic Methods

Автор: Stephan Stuerwald
Название: Digital Holographic Methods
ISBN: 3030130878 ISBN-13(EAN): 9783030130879
Издательство: Springer
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Цена: 12577.00 р.
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Описание: This book presents not only the simultaneous combination of optical methods based on holographic principles for marker-free imaging, real-time trapping, identification and tracking of micro objects, but also the application of substantial low coherent light sources and non-diffractive beams. It first provides an overview of digital holographic microscopy (DHM) and holographic optical tweezers as well as non-diffracting beam types for minimal-invasive, real-time and marker-free imaging as well as manipulation of micro and nano objects.It then investigates the design concepts for the optical layout of holographic optical tweezers (HOTs) and their optimization using optical simulations and experimental methods. In a further part, the book characterizes the corresponding system modules that allow the addition of HOTs to commercial microscopes with regard to stability and diffraction efficiency. Further, based on experiments and microfluidic applications, it demonstrates the functionality of the combined setup, and discusses several types of non-diffracting beams and their application in optical manipulation. The book shows that holographic optical tweezers, including several non-diffracting beam types like Mathieu beams, combined parabolic and Airy beams, not only open up the possibility of generating efficient multiple dynamic traps for micro and nano particles with forces in the pico and nano newton range, but also the opportunity to exert optical torque with special beams like Bessel beams, which can facilitate the movement and rotation of particles by generating microfluidic flows. The last part discusses the potential use of a slightly modified DHM-HOT-system to explore the functionality of direct laser writing based on a two photon absorption process in a negative photoresist with a continuous wave laser

Digital Holographic Methods

Автор: Stephan Stuerwald
Название: Digital Holographic Methods
ISBN: 3030001687 ISBN-13(EAN): 9783030001681
Издательство: Springer
Рейтинг:
Цена: 15372.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book presents not only the simultaneous combination of optical methods based on holographic principles for marker-free imaging, real-time trapping, identification and tracking of micro objects, but also the application of substantial low coherent light sources and non-diffractive beams. It first provides an overview of digital holographic microscopy (DHM) and holographic optical tweezers as well as non-diffracting beam types for minimal-invasive, real-time and marker-free imaging as well as manipulation of micro and nano objects.It then investigates the design concepts for the optical layout of holographic optical tweezers (HOTs) and their optimization using optical simulations and experimental methods. In a further part, the book characterizes the corresponding system modules that allow the addition of HOTs to commercial microscopes with regard to stability and diffraction efficiency. Further, based on experiments and microfluidic applications, it demonstrates the functionality of the combined setup, and discusses several types of non-diffracting beams and their application in optical manipulation. The book shows that holographic optical tweezers, including several non-diffracting beam types like Mathieu beams, combined parabolic and Airy beams, not only open up the possibility of generating efficient multiple dynamic traps for micro and nano particles with forces in the pico and nano newton range, but also the opportunity to exert optical torque with special beams like Bessel beams, which can facilitate the movement and rotation of particles by generating microfluidic flows. The last part discusses the potential use of a slightly modified DHM-HOT-system to explore the functionality of direct laser writing based on a two photon absorption process in a negative photoresist with a continuous wave laser

Coherent Raman Scattering Microscopy

Автор: Cheng, Ji-Xin
Название: Coherent Raman Scattering Microscopy
ISBN: 1439867658 ISBN-13(EAN): 9781439867655
Издательство: Taylor&Francis
Рейтинг:
Цена: 31390.00 р.
Наличие на складе: Поставка под заказ.


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