Cellular Electron Microscopy, McIntosh, J. Richard
Автор: Zewail, Ahmed H. Thomas, John M. Название: 4d electron microscopy ISBN: 1848163908 ISBN-13(EAN): 9781848163904 Издательство: World Scientific Publishing Рейтинг: Цена: 12751.00 р. 18216.00-30% Наличие на складе: Есть (2 шт.) Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.
Автор: Thomas Mueller-Reichert Название: Correlative Light and Electron MIcroscopy,111 ISBN: 0124160263 ISBN-13(EAN): 9780124160262 Издательство: Elsevier Science Рейтинг: Цена: 19875.00 р. Наличие на складе: Поставка под заказ.
Описание: Covers areas of CLEM including a brief history and overview on CLEM methods, imaging of intermediate stages of meiotic spindle assembly in C. This title includes a brief history and overview on CLEM methods.
Автор: Goodhew Название: Electron Microscopy & Analysis ISBN: 0748409688 ISBN-13(EAN): 9780748409686 Издательство: Taylor&Francis Рейтинг: Цена: 12248.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.
Описание: * Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations * Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer.
Название: Encyclopedia of Scanning Electron Microscopy ISBN: 1632381664 ISBN-13(EAN): 9781632381668 Издательство: Неизвестно Цена: 23335.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections Instrumentation, Methodology and Biology, Medicine for electronic industry. This book includes contributions by renowned researchers and experts in this field.
Автор: Liu, Jian Tan, Jiubin Название: Confocal microscopy ISBN: 1681743361 ISBN-13(EAN): 9781681743363 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 6237.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.
Автор: Randle, Valerie Название: The Measurement of Grain Boundary Geometry ISBN: 0367402351 ISBN-13(EAN): 9780367402358 Издательство: Taylor&Francis Рейтинг: Цена: 9186.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
As the selection of material for particular engineering properties becomes increasingly important in keeping costs down, methods for evaluating material properties also become more relevant. One such method examines the geometry of grain boundaries, which reveals much about the properties of the material.
Studying material properties from their geometrical measurements, The Measurement of Grain Boundary Geometry provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. The book presents an overview of the developments in the theory of grain boundary geometry and its practical applications in material engineering. It also covers the tunneling electron microscope (TEM), experimental aspects of data collection, data processing, and examples from actual investigations. Each step of the analysis process is clearly described, from data collection through processing, analysis, representation, and display to applications. The book also includes a glossary of terms. Exploring both the experimental and analytical aspects of the subject, this practical reference guide is essential for researchers and students involved in material properties, whether in physics, materials science, metallurgy, or physical chemistry.
Автор: Hawkes Peter W., Hytch Martin Название: The Beginnings of Electron Microscopy - Part 2: Volume 221 ISBN: 0323989195 ISBN-13(EAN): 9780323989190 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.
Автор: Hirsch, Peter. B Название: Topics in Electron Diffraction and Microscopy of Materials ISBN: 075030538X ISBN-13(EAN): 9780750305389 Издательство: Taylor&Francis Рейтинг: Цена: 25265.00 р. Наличие на складе: Поставка под заказ.
Название: Coherent Raman Scattering Microscopy ISBN: 1138199524 ISBN-13(EAN): 9781138199521 Издательство: Taylor&Francis Рейтинг: Цена: 11482.00 р. Наличие на складе: Поставка под заказ.
Автор: Cavalier, Annie Название: In Situ Hybridization in Electron Microscopy ISBN: 0849300444 ISBN-13(EAN): 9780849300448 Издательство: Taylor&Francis Рейтинг: Цена: 33686.00 р. Наличие на складе: Поставка под заказ.
Автор: David G. Robinson; David G. Robinson; K. M?hlethal Название: Methods of Preparation for Electron Microscopy ISBN: 354017592X ISBN-13(EAN): 9783540175926 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Many competent biological and medical research workers expressed their anxiety that objects in high vacuum would be modified due to complete dehydration and the absorbed electron energy would eventually cause degrada- tion to rudimentary carbon backbones.
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