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X-ray Microscopy, Ping-chin Cheng; Gwo-jen Jan


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Автор: Ping-chin Cheng; Gwo-jen Jan
Название:  X-ray Microscopy
ISBN: 9783642728839
Издательство: Springer
Классификация:

ISBN-10: 3642728839
Обложка/Формат: Soft cover
Страницы: 415
Вес: 0.75 кг.
Дата издания: 10.12.2011
Язык: English
Издание: Softcover reprint of
Иллюстрации: Xv, 415 p. with 16 falttafeln.
Размер: 244 x 170 x 23
Читательская аудитория: Professional & vocational
Основная тема: Cell Biology
Подзаголовок: Instrumentation and Biological Applications
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: In 1979, a conference on x-ray microscopy was organized by the New York Academy of Sciences, and in 1983, the Second Interna- tional Symposium on X-ray Imaging was organized by the Akademie der Wissenschaften in Gottingen, Federal Republic of Germany.


Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 19591.00 р.
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Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 14673.00 р.
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Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 18284.00 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Basic Confocal Microscopy

Автор: Robert Price; Jay Jerome (Eds.)
Название: Basic Confocal Microscopy
ISBN: 0387781749 ISBN-13(EAN): 9780387781747
Издательство: Springer
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Цена: 26122.00 р.
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Описание: Most researchers agree that biological confocal microscopy was jump-started by the confocal design first published by White and Amos in 1985 in the Journal of Cell Biology. As a result, this remains a relatively young field. Yet the use of the technique has grown phenomenally since those early efforts, with new users joining the ranks daily. The publication of Basic Confocal Microscopy reflects the burgeoning need to train new students, technologists, and faculty wishing to use confocal microscopy in their research. A direct outgrowth of the authors’ five-day intensive course in the subject begun in 2005, this book covers the basics and includes all the information required to design, implement, and interpret the results of, biological experiments based on confocal microscopy. Concise yet comprehensive, the volume begins by covering the core issues of fluorescence, specimen preparation and labeling, before moving on to address the analog-to-digital conversion of specimen data gathered using confocal microscopy. Subsequent chapters detail the practicalities of operating confocal microscopes, providing all the information necessary to begin practicing confocal microscopy as well as optimizing the material obtained. The final block of chapters examine 3-dimensional analysis and the reconstruction of data sets, outline some of the ethical considerations in confocal imaging, and then supply a number of resources that the authors have found useful in their own work. Once readers have mastered the information this book presents, the resources found in its pages will be an excellent guide to continued learning about the more advanced forms of confocal microscopy.

Techniques in Confocal Microscopy,

Автор: P. Michael Conn
Название: Techniques in Confocal Microscopy,
ISBN: 0123846587 ISBN-13(EAN): 9780123846587
Издательство: Elsevier Science
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Цена: 10273.00 р.
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Описание:

As part of the Reliable Lab Solutions series, Techniques in Confocal Microscopy brings together chapters from volumes 302, 307 and 356 of Methods in Enzymology. It documents many diverse uses for confocal microscopy in disciplines that broadly span biology.

It documents many diverse uses for confocal microscopy in disciplines that broadly span biology. The methods presented include shortcuts and conveniences not included in the initial publications Techniques are described in a context that allows comparisons to other related methodologies. Methodologies are laid out in a manner that stresses their general applicability and reports their potential limitations.

Scanning Probe Microscopy for Energy Research

Автор: Bonnell Dawn A
Название: Scanning Probe Microscopy for Energy Research
ISBN: 9814434701 ISBN-13(EAN): 9789814434706
Издательство: World Scientific Publishing
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Цена: 31680.00 р.
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Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Quantum Microscopy of Biological Systems

Автор: Michael Taylor
Название: Quantum Microscopy of Biological Systems
ISBN: 3319189379 ISBN-13(EAN): 9783319189376
Издательство: Springer
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Цена: 14365.00 р.
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Описание: Introduction.- Practical Quantum Measurements.- Introductory Theory of Optical Tweezers.- The Total Information Carried by the Light.- The Quantum Noise Limit for a Specific Measurement.- Characterizing Quadrant Detection.- Interferometer Enhanced Particle Tracking.- Homodyne Based Particle Tracking.- Lock-In Particle Tracking.- Selective Measurement by Optimized Dark-Field Illumination Angle.- Technical Constraints on Sensitivity.- Surpassing the Quantum Limit.- Biological Measurement Beyond the Quantum Limit.- Sub diffraction-Limited Quantum Imaging of a Living Cell.- Further Extensions.- Summary and Conclusion.

Modeling Nanoscale Imaging in Electron Microscopy

Автор: Thomas Vogt; Wolfgang Dahmen; Peter Binev
Название: Modeling Nanoscale Imaging in Electron Microscopy
ISBN: 1489997288 ISBN-13(EAN): 9781489997289
Издательство: Springer
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Цена: 15672.00 р.
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Описание: This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Advanced Transmission Electron Microscopy

Автор: Francis Leonard Deepak; Alvaro Mayoral; Raul Arena
Название: Advanced Transmission Electron Microscopy
ISBN: 3319151762 ISBN-13(EAN): 9783319151762
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials.

Analytical Transmission Electron Microscopy

Автор: J?rgen Thomas; Thomas Gemming
Название: Analytical Transmission Electron Microscopy
ISBN: 9401786003 ISBN-13(EAN): 9789401786003
Издательство: Springer
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Цена: 10480.00 р.
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Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.

Fundamentals of Light Microscopy and Electronic Imaging, 2nd Edition

Автор: Murphy Douglas B. , Davidson Michael W.
Название: Fundamentals of Light Microscopy and Electronic Imaging, 2nd Edition
ISBN: 047169214X ISBN-13(EAN): 9780471692140
Издательство: Wiley
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Цена: 21693.00 р.
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Описание: Fundamentals of Light Microscopy and Electronic Imaging, Second Edition provides a coherent introduction to the principles and applications of the integrated optical microscope system, covering both theoretical and practical considerations.

X-Ray Microscopy III

Автор: Alan G. Michette; Graeme R. Morrison; Christopher
Название: X-Ray Microscopy III
ISBN: 3662138948 ISBN-13(EAN): 9783662138946
Издательство: Springer
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Цена: 16979.00 р.
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Описание: The growth of interest and research activity in X -ray microscopy is reflected in the increasing size and scope of a related series of international conferences, the latest of which (XRM90) was held at King`s College London (3-7 September 1990) with over 130 delegates.


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