X-Ray Microscopy III, Alan G. Michette; Graeme R. Morrison; Christopher
Автор: Murphy Douglas B. , Davidson Michael W. Название: Fundamentals of Light Microscopy and Electronic Imaging, 2nd Edition ISBN: 047169214X ISBN-13(EAN): 9780471692140 Издательство: Wiley Рейтинг: Цена: 21693.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Fundamentals of Light Microscopy and Electronic Imaging, Second Edition provides a coherent introduction to the principles and applications of the integrated optical microscope system, covering both theoretical and practical considerations.
Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Автор: Zewail, A.H. Название: 4D Electron Microscopy ISBN: 1848164009 ISBN-13(EAN): 9781848164000 Издательство: World Scientific Publishing Рейтинг: Цена: 6336.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Compares the merits of coherent electron waves with those of synchrotron radiation. This book exposes the paradigm concepts and the developed techniques that can be executed to gain knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time.
Автор: Roland Wiesendanger; Hans-Joachim G?ntherodt Название: Scanning Tunneling Microscopy III ISBN: 3540608249 ISBN-13(EAN): 9783540608240 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Providing an introduction to the theoretical foundations of STM and related scanning probe methods, this work outlines the various theoretical concepts developed in the past, and discusses the implications of the theoretical results for the interpretation of experimental data.
Автор: Ping-chin Cheng; Gwo-jen Jan Название: X-ray Microscopy ISBN: 3642728839 ISBN-13(EAN): 9783642728839 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In 1979, a conference on x-ray microscopy was organized by the New York Academy of Sciences, and in 1983, the Second Interna- tional Symposium on X-ray Imaging was organized by the Akademie der Wissenschaften in Gottingen, Federal Republic of Germany.
Автор: J.K. Koehler; A.P. Aguas; M.F. Barbosa; R.P. Bolen Название: Advanced Techniques in Biological Electron Microscopy III ISBN: 3540164006 ISBN-13(EAN): 9783540164005 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume is a continuation of two prior books on advanced electron microscope techniques. The mission of the present volume remains that of a source book for the research practitioner or advanced student, especially one already well versed in basic electron optical methods.
Автор: Muller-Reichert, Thomas Название: Correlative Light and Electron Microscopy III ISBN: 0128099755 ISBN-13(EAN): 9780128099759 Издательство: Elsevier Science Рейтинг: Цена: 21222.00 р. Наличие на складе: Поставка под заказ.
Описание:
Correlative Light and Electron Microscopy III, Volume 140, a new volume in the Methods in Cell Biology, series continues the legacy of this premier serial with quality chapters authored by leaders in the field.
This is the third volume of Methods in Cell Biology covering current Correlative Light and Electron Microscopy (CLEM) methodologies. The field of CLEM is still growing and new combinations of imaging technologies provide exciting new insights. The chapters deal with different approaches to analyze the same specimen by more than one imaging technique to gain more and/or better information over applying each imaging technique separately. The strengths and application area of each presented CLEM approach are highlighted.
This volume explores the aspects of sample preparation of diverse biological systemsfor different CLEM approaches and will serve as a valuable resource to researchers in the field of cell biology.
Contains contributions from experts in the field
Covered topics include targeted ultramicrotomy and high-precision correlation
Presents recent advances and currently applied correlative approaches
Gives detailed protocols allowing the application of workflows in one's own laboratory setting
Covers CLEM approaches in the context of specific applications
Aims to stimulate the use of new combinations of imaging modalities
Название: Advanced fluorescence microscopy ISBN: 1493920790 ISBN-13(EAN): 9781493920792 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Thomas Vogt; Wolfgang Dahmen; Peter Binev Название: Modeling Nanoscale Imaging in Electron Microscopy ISBN: 1489997288 ISBN-13(EAN): 9781489997289 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Автор: David Sayre; Malcolm Howells; Janos Kirz; Harvey R Название: X-Ray Microscopy II ISBN: 3662144905 ISBN-13(EAN): 9783662144909 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987.
Автор: G. Schmahl; D. Rudolph Название: X-Ray Microscopy ISBN: 3662135477 ISBN-13(EAN): 9783662135471 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the de- velopment of optical elements for soft x-rays render x-ray microscopy feasi- ble for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the sympos i um "X-Ray Microscopy", organ i zed by the Akademie der Wi ssen- schaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are in- debted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut fUr Stromungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts.
Автор: Udo J. Birk Название: Super-Resolution Microscopy - A Practical Guide ISBN: 3527341331 ISBN-13(EAN): 9783527341337 Издательство: Wiley Рейтинг: Цена: 15674.00 р. Наличие на складе: Поставка под заказ.
Описание: This unique book on super-resolution microscopy techniques presents comparative, in-depth analyses of the strengths and weaknesses of the individual approaches.
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