Автор: Zewail, Ahmed H. Thomas, John M. Название: 4d electron microscopy ISBN: 1848163908 ISBN-13(EAN): 9781848163904 Издательство: World Scientific Publishing Рейтинг: Цена: 12751.00 р. 18216.00-30% Наличие на складе: Есть (2 шт.) Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.
Автор: P. Michael Conn Название: Techniques in Confocal Microscopy, ISBN: 0123846587 ISBN-13(EAN): 9780123846587 Издательство: Elsevier Science Рейтинг: Цена: 10273.00 р. Наличие на складе: Поставка под заказ.
Описание:
As part of the Reliable Lab Solutions series, Techniques in Confocal Microscopy brings together chapters from volumes 302, 307 and 356 of Methods in Enzymology. It documents many diverse uses for confocal microscopy in disciplines that broadly span biology.
It documents many diverse uses for confocal microscopy in disciplines that broadly span biology. The methods presented include shortcuts and conveniences not included in the initial publications Techniques are described in a context that allows comparisons to other related methodologies. Methodologies are laid out in a manner that stresses their general applicability and reports their potential limitations.
Автор: Murphy Douglas B. , Davidson Michael W. Название: Fundamentals of Light Microscopy and Electronic Imaging, 2nd Edition ISBN: 047169214X ISBN-13(EAN): 9780471692140 Издательство: Wiley Рейтинг: Цена: 21693.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Fundamentals of Light Microscopy and Electronic Imaging, Second Edition provides a coherent introduction to the principles and applications of the integrated optical microscope system, covering both theoretical and practical considerations.
Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Автор: Muller-Reichert, Thomas Название: Correlative Light and Electron Microscopy III ISBN: 0128099755 ISBN-13(EAN): 9780128099759 Издательство: Elsevier Science Рейтинг: Цена: 21222.00 р. Наличие на складе: Поставка под заказ.
Описание:
Correlative Light and Electron Microscopy III, Volume 140, a new volume in the Methods in Cell Biology, series continues the legacy of this premier serial with quality chapters authored by leaders in the field.
This is the third volume of Methods in Cell Biology covering current Correlative Light and Electron Microscopy (CLEM) methodologies. The field of CLEM is still growing and new combinations of imaging technologies provide exciting new insights. The chapters deal with different approaches to analyze the same specimen by more than one imaging technique to gain more and/or better information over applying each imaging technique separately. The strengths and application area of each presented CLEM approach are highlighted.
This volume explores the aspects of sample preparation of diverse biological systemsfor different CLEM approaches and will serve as a valuable resource to researchers in the field of cell biology.
Contains contributions from experts in the field
Covered topics include targeted ultramicrotomy and high-precision correlation
Presents recent advances and currently applied correlative approaches
Gives detailed protocols allowing the application of workflows in one's own laboratory setting
Covers CLEM approaches in the context of specific applications
Aims to stimulate the use of new combinations of imaging modalities
Автор: Zurch, Michael Werner Название: High-resolution extreme ultraviolet microscopy ISBN: 3319123874 ISBN-13(EAN): 9783319123875 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Finally, this book presents a newly developed technique of generating structured illumination by means of so-called optical vortex beams in the extreme ultraviolet regime and proposes its general usability for super-resolution imaging.
Автор: J?rgen Thomas; Thomas Gemming Название: Analytical Transmission Electron Microscopy ISBN: 9401786003 ISBN-13(EAN): 9789401786003 Издательство: Springer Рейтинг: Цена: 10480.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.
Автор: Zewail, A.H. Название: 4D Electron Microscopy ISBN: 1848164009 ISBN-13(EAN): 9781848164000 Издательство: World Scientific Publishing Рейтинг: Цена: 6336.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Compares the merits of coherent electron waves with those of synchrotron radiation. This book exposes the paradigm concepts and the developed techniques that can be executed to gain knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time.
Автор: Ping-chin Cheng; Gwo-jen Jan Название: X-ray Microscopy ISBN: 3642728839 ISBN-13(EAN): 9783642728839 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In 1979, a conference on x-ray microscopy was organized by the New York Academy of Sciences, and in 1983, the Second Interna- tional Symposium on X-ray Imaging was organized by the Akademie der Wissenschaften in Gottingen, Federal Republic of Germany.
Автор: Alan G. Michette; Graeme R. Morrison; Christopher Название: X-Ray Microscopy III ISBN: 3662138948 ISBN-13(EAN): 9783662138946 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The growth of interest and research activity in X -ray microscopy is reflected in the increasing size and scope of a related series of international conferences, the latest of which (XRM90) was held at King`s College London (3-7 September 1990) with over 130 delegates.
Автор: David Sayre; Malcolm Howells; Janos Kirz; Harvey R Название: X-Ray Microscopy II ISBN: 3662144905 ISBN-13(EAN): 9783662144909 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987.
Название: Advanced fluorescence microscopy ISBN: 1493920790 ISBN-13(EAN): 9781493920792 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
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