X-Ray Microscopy II, David Sayre; Malcolm Howells; Janos Kirz; Harvey R
Автор: Murphy Douglas B. , Davidson Michael W. Название: Fundamentals of Light Microscopy and Electronic Imaging, 2nd Edition ISBN: 047169214X ISBN-13(EAN): 9780471692140 Издательство: Wiley Рейтинг: Цена: 21693.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Fundamentals of Light Microscopy and Electronic Imaging, Second Edition provides a coherent introduction to the principles and applications of the integrated optical microscope system, covering both theoretical and practical considerations.
Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Описание: Confocal and two-photon fluorescence microscopy has provided researchers with unique possibilities of three-dimensional imaging in media like human tissue or semiconductor integrated circuits.
Автор: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Rola Название: Noncontact Atomic Force Microscopy ISBN: 3319155873 ISBN-13(EAN): 9783319155876 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Noncontact Atomic Force Microscopy
Автор: Zewail, A.H. Название: 4D Electron Microscopy ISBN: 1848164009 ISBN-13(EAN): 9781848164000 Издательство: World Scientific Publishing Рейтинг: Цена: 6336.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Compares the merits of coherent electron waves with those of synchrotron radiation. This book exposes the paradigm concepts and the developed techniques that can be executed to gain knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time.
Автор: Alan G. Michette; Graeme R. Morrison; Christopher Название: X-Ray Microscopy III ISBN: 3662138948 ISBN-13(EAN): 9783662138946 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The growth of interest and research activity in X -ray microscopy is reflected in the increasing size and scope of a related series of international conferences, the latest of which (XRM90) was held at King`s College London (3-7 September 1990) with over 130 delegates.
Автор: Ping-chin Cheng; Gwo-jen Jan Название: X-ray Microscopy ISBN: 3642728839 ISBN-13(EAN): 9783642728839 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In 1979, a conference on x-ray microscopy was organized by the New York Academy of Sciences, and in 1983, the Second Interna- tional Symposium on X-ray Imaging was organized by the Akademie der Wissenschaften in Gottingen, Federal Republic of Germany.
Автор: Eugenio F. Fornasiero; Silvio O. Rizzoli Название: Super-Resolution Microscopy Techniques in the Neurosciences ISBN: 1627039821 ISBN-13(EAN): 9781627039826 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Super-Resolution Microscopy Techniques in the Neurosciences serves as a comprehensive description of current super-resolution techniques, including the physical principles that allowed for their development, some of the most recent neurobiological applications and selected information for the practical use of these technologies.
Автор: Muller-Reichert, Thomas Название: Correlative Light and Electron Microscopy III ISBN: 0128099755 ISBN-13(EAN): 9780128099759 Издательство: Elsevier Science Рейтинг: Цена: 21222.00 р. Наличие на складе: Поставка под заказ.
Описание:
Correlative Light and Electron Microscopy III, Volume 140, a new volume in the Methods in Cell Biology, series continues the legacy of this premier serial with quality chapters authored by leaders in the field.
This is the third volume of Methods in Cell Biology covering current Correlative Light and Electron Microscopy (CLEM) methodologies. The field of CLEM is still growing and new combinations of imaging technologies provide exciting new insights. The chapters deal with different approaches to analyze the same specimen by more than one imaging technique to gain more and/or better information over applying each imaging technique separately. The strengths and application area of each presented CLEM approach are highlighted.
This volume explores the aspects of sample preparation of diverse biological systemsfor different CLEM approaches and will serve as a valuable resource to researchers in the field of cell biology.
Contains contributions from experts in the field
Covered topics include targeted ultramicrotomy and high-precision correlation
Presents recent advances and currently applied correlative approaches
Gives detailed protocols allowing the application of workflows in one's own laboratory setting
Covers CLEM approaches in the context of specific applications
Aims to stimulate the use of new combinations of imaging modalities
Автор: Francis Leonard Deepak; Alvaro Mayoral; Raul Arena Название: Advanced Transmission Electron Microscopy ISBN: 3319151762 ISBN-13(EAN): 9783319151762 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials.
Автор: G. Schmahl; D. Rudolph Название: X-Ray Microscopy ISBN: 3662135477 ISBN-13(EAN): 9783662135471 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the de- velopment of optical elements for soft x-rays render x-ray microscopy feasi- ble for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the sympos i um "X-Ray Microscopy", organ i zed by the Akademie der Wi ssen- schaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are in- debted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut fUr Stromungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts.
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