Автор: S. Morita; Roland Wiesendanger; E. Meyer Название: Noncontact Atomic Force Microscopy ISBN: 3642627722 ISBN-13(EAN): 9783642627729 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);
Автор: Reifenberger Ronald Название: Fundamentals of Atomic Force Microscopy - Part I: Foundations ISBN: 9814630349 ISBN-13(EAN): 9789814630344 Издательство: World Scientific Publishing Рейтинг: Цена: 15048.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https: //nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Описание: Introduction.- Immobilization methods for observing living cells.- Label-free measuring the mechanics of single cells.- Single-molecule recognition and force measurements.- Mapping membrane proteins on cell surface.- Applications of single-cell and single-molecule physiological properties characterization methods in clinical lymphoma treatment.- Conclusion.
Описание: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.
Автор: Seizo Morita; Franz J. Giessibl; Roland Wiesendang Название: Noncontact Atomic Force Microscopy ISBN: 3642260705 ISBN-13(EAN): 9783642260704 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.
Автор: Reifenberger Ronald G Название: Fundamentals Of Atomic Force Microscopy - Part I: Foundations ISBN: 9814630357 ISBN-13(EAN): 9789814630351 Издательство: World Scientific Publishing Рейтинг: Цена: 6336.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Автор: Wright Kate Название: Scientific Researches in Atomic Force Microscopy ISBN: 1632384094 ISBN-13(EAN): 9781632384096 Издательство: Неизвестно Цена: 22990.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Rola Название: Noncontact Atomic Force Microscopy ISBN: 3319155873 ISBN-13(EAN): 9783319155876 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Noncontact Atomic Force Microscopy
Автор: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Rola Название: Noncontact Atomic Force Microscopy ISBN: 3319358766 ISBN-13(EAN): 9783319358765 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.- Revealing Subsurface Vibrational Modes by Atom-Resolved Damping Force Spectroscopy.- Interaction and Self-Assembly of Organic Molecules on Insulating Surfaces.- NC-AFM Experiments on Molecular Systems.- Single-Molecule Force Spectroscopy.- Submolecular Resolution and Tip Functionalization.- Mapping the Force-Fields of Intra- and Intermolecular Bonds.- Single-Molecule Force-Sensor Assisted Scanning Tunneling Microscopy.- Nanostructured Surfaces of Doped Alkali Halides.- The Atomic Structure of Two-Dimensional Silica.- NC-AFM Imaging of Molecules at Surfaces of Bulk Insulators.- Simulating NC-AFM of Complex Systems.- Recent Progress in Frequency Modulation Atomic Force Microscopy in Liquids.- Subnanometer-Resolution FM-AFM Imaging at Solid/Liquid Interfaces.- High Spatial-Resolution AFM Studies of Electrochemical Interfaces.- High-Speed Atomic Force Microscopic Observation of Motor Proteins.
Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy ISBN: 0306448904 ISBN-13(EAN): 9780306448904 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2 ISBN: 030645596X ISBN-13(EAN): 9780306455964 Издательство: Springer Рейтинг: Цена: 22201.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Название: Atomic force microscopy ISBN: 149398893X ISBN-13(EAN): 9781493988938 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book aims to provide examples of applications of atomic force microscopy (AFM) using biological samples, showing different methods for AFM sample preparation, data acquisition and processing, and avoiding technical problems. Divided into two sections, chapters guide readers through image artifacts, process and quantitatively analyze AFM images, lipid bilayers, image DNA-protein complexes, AFM cell topography, single-molecule force spectroscopy, single-molecule dynamic force spectroscopy, fluorescence methodologies, molecular recognition force spectroscopy, biomechanical characterization, AFM-based biosensor setup, and detail how to implement such an in vitro system, which can monitor cardiac electrophysiology, intracellular calcium dynamics, and single cell mechanics. Written in the highly successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible laboratory protocols, and tips on troubleshooting and avoiding known pitfalls.Authoritative and cutting-edge, Atomic Force Microscopy: Methods and Protocols is useful for researchers at different stages, from newcomers to experienced users, interested in new AFM applications.
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