Автор: David S. Simon; Gregg Jaeger; Alexander V. Sergien Название: Quantum Metrology, Imaging, and Communication ISBN: 331946549X ISBN-13(EAN): 9783319465494 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Название: Handbook of Optical Metrology ISBN: 1138112089 ISBN-13(EAN): 9781138112087 Издательство: Taylor&Francis Рейтинг: Цена: 12554.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals.
Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications.
With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.
Описание: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.
Автор: Abundio Davila Название: Handbook of Speckle Interferometry ISBN: 1510645381 ISBN-13(EAN): 9781510645387 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 6897.00 р. Наличие на складе: Нет в наличии.
Описание: This handbook introduces speckle techniques to nonspecialists to help them understand the basic principles of speckle interferometry. The book mainly focuses on the use of speckle patterns with direct phase-measuring methods that produce an instantaneous phase. The major electronic speckle pattern interferometry (ESPI) techniques are presented using simplified mathematical notation that includes rigid-body and standard-body displacements to estimate object pose changes with six degrees of freedom. Additionally, the adoption of temporal phase unwrapping instead of spatial phase unwrapping is promoted. This handbook also includes a summary of recent industrial applications, with an update on current research in the ESPI field.
Автор: P. Jacquot; J.-M. Fournier Название: Interferometry in Speckle Light ISBN: 3642632300 ISBN-13(EAN): 9783642632303 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the International Conference 25-28 September 2000, Lausanne, Switzerland
Автор: Quinten Michael Название: A Practical Guide to Surface Metrology ISBN: 3030294560 ISBN-13(EAN): 9783030294564 Издательство: Springer Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Practical Guide to Surface MetrologyMichael QuintenPreface1 Introduction to Surfaces and Surface Metrology1.1 Microscopic View on a Surface1.2 Macroscopic View on a Surface1.3 Measurement and Validation1.4 The Way To Reliable Surface Data2 Tactile Surface Metrology2.1 Tactile Surface Profiling2.2 Atomic Force Microscopy3 Capacitive And Inductive Surface Metrology3.1 Capacitive Surface Profiling3.2 Surface Profiling With Eddy Currents4 Optical Surface Metrology4.1 Physical Basics4.1.1 Electromagnetic waves4.1.2 Huygens-Fresnel principle of wave propagation4.1.3 Polarization4.1.4 Interference4.1.5 Coherence4.1.6 Dielectric Function and Refractive Index4.1.7 Reflection and Refraction4.1.8 Dispersion Effects4.1.9 Diffraction4.1.10 Scattering4.2 Chromatic Confocal Surface Profiling4.3 Surface Profiling with an Autofocus Sensor4.4 Light Sectional Methods4.4.1 Triangulation4.4.2 Line Projection4.4.3 Fringe Projection4.5 Microscopy Methods4.5.1 Classical Microscopy4.5.2 Confocal Microscopy4.5.3 Focal Depth Variation4.5.4 Scanning Near-Field Optical Microscopy4.6 Interferometric Methods4.6.1 Interferometric Form Inspection4.6.1.1 Form inspection of planar surfaces4.6.1.2 Form inspection of spherical, aspherical and freeform surfaces4.6.2 Tilted Wave Interferometry4.6.3 White Light Interferometry4.6.4 Multi-Wavelength Interferometry4.6.5 Grazing Incidence Interferometry4.6.6 Digital Holographic Microscopy4.6.7 Shearing Interferometry (Conoscopy)4.7 Wave Front Sensing (Shack-Hartmann)4.8 Deflectometry4.9 Makyoh Topography Sensor4.10 Surface Profiling Using Elastic Light Scattering4.10.1 Total Integrated Scattering (TIS)4.10.2 Angular Resolved Scattering (ARS)4.10.3 Speckle Based Roughness Determination4.11 Spectral Analysis and Characterization4.11.1 Reflectometry4.11.1.1 Optical Film Thickness Determination4.11.1.2 Critical Dimensions Determination4.11.2 Spectroscopic Ellipsometry5 Imaging Methods5.1 Classical Imaging5.2 Spectral Imaging5.3 Scanning Electron Microscopy5.4 Optical Coherence Tomography5.5 Terahertz Spectroscopy6 Multisensor - Systems - A Versatile Approach To Surface Metrology7 Appendices7.1 Appendix A: Numerics With Complex Numbers7.2 Appendix B: Levenberg-Marquardt Algorithm8 ReferencesIndex
Автор: Stephan Stuerwald Название: Digital Holographic Methods ISBN: 3030130878 ISBN-13(EAN): 9783030130879 Издательство: Springer Рейтинг: Цена: 12577.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents not only the simultaneous combination of optical methods based on holographic principles for marker-free imaging, real-time trapping, identification and tracking of micro objects, but also the application of substantial low coherent light sources and non-diffractive beams. It first provides an overview of digital holographic microscopy (DHM) and holographic optical tweezers as well as non-diffracting beam types for minimal-invasive, real-time and marker-free imaging as well as manipulation of micro and nano objects.It then investigates the design concepts for the optical layout of holographic optical tweezers (HOTs) and their optimization using optical simulations and experimental methods. In a further part, the book characterizes the corresponding system modules that allow the addition of HOTs to commercial microscopes with regard to stability and diffraction efficiency. Further, based on experiments and microfluidic applications, it demonstrates the functionality of the combined setup, and discusses several types of non-diffracting beams and their application in optical manipulation. The book shows that holographic optical tweezers, including several non-diffracting beam types like Mathieu beams, combined parabolic and Airy beams, not only open up the possibility of generating efficient multiple dynamic traps for micro and nano particles with forces in the pico and nano newton range, but also the opportunity to exert optical torque with special beams like Bessel beams, which can facilitate the movement and rotation of particles by generating microfluidic flows. The last part discusses the potential use of a slightly modified DHM-HOT-system to explore the functionality of direct laser writing based on a two photon absorption process in a negative photoresist with a continuous wave laser
Автор: Horn Название: The Physics of Laser Radiation–Matter Interaction ISBN: 303115861X ISBN-13(EAN): 9783031158612 Издательство: Springer Рейтинг: Цена: 9083.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This textbook explains the fundamental processes involved in the interaction of electromagnetic radiation with matter. It leads students from a general discussion of electrodynamics, forming the mathematical foundation for the Maxwell equations, to key results such as the Fresnel equations, Snell’s law, and the Brewster angle, deriving along the way the equations for accelerated charges and discussing dipole radiation, Bremsstrahlung and synchrotron radiation. By considering more and more interacting particles, the book advances its treatment of the subject, approaching the solid-state regime using both classical and quantum mechanical approaches to describe interaction paths with electromagnetic radiation. Finally, specific interactions of laser radiation with matter are explained such as ultrafast, coherent, and selective interaction. With an emphasis on achieving an intuitive grasp of the basic physics underlying common laser technology, this textbook is ideal for graduate students seeking both a better fundamental and applied understanding of laser–matter interaction.
Автор: Michael Quinten Название: A Practical Guide to Surface Metrology ISBN: 3030294536 ISBN-13(EAN): 9783030294533 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).The book provides:Overview of the working principlesDescription of advantages and disadvantagesCurrently achievable numbers for resolutions, repeatability, and reproducibilityExamples of real-world applicationsA final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization ofsurfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.
Автор: Selim Shahriar, Jacob Scheuer Название: Slow Light, Fast Light, and Opto-Atomic Precision Metrology X ISBN: 1510606793 ISBN-13(EAN): 9781510606791 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 18295.00 р. Наличие на складе: Нет в наличии.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Simon David S., Jaeger Gregg, Sergienko Alexander V. Название: Quantum Metrology, Imaging, and Communication ISBN: 3319835408 ISBN-13(EAN): 9783319835402 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
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