Specimen Preparation for Transmission Electron Microscopy of Materials, Goodhew, PJ
Автор: Zewail, Ahmed H. Thomas, John M. Название: 4d electron microscopy ISBN: 1848163908 ISBN-13(EAN): 9781848163904 Издательство: World Scientific Publishing Рейтинг: Цена: 12751.00 р. 18216.00-30% Наличие на складе: Есть (2 шт.) Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.
Автор: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Название: Sample Preparation Handbook for Transmission Electron Microscopy ISBN: 1489998853 ISBN-13(EAN): 9781489998859 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis.
Автор: Zurch, Michael Werner Название: High-resolution extreme ultraviolet microscopy ISBN: 3319123874 ISBN-13(EAN): 9783319123875 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Finally, this book presents a newly developed technique of generating structured illumination by means of so-called optical vortex beams in the extreme ultraviolet regime and proposes its general usability for super-resolution imaging.
Автор: J?rgen Thomas; Thomas Gemming Название: Analytical Transmission Electron Microscopy ISBN: 9401786003 ISBN-13(EAN): 9789401786003 Издательство: Springer Рейтинг: Цена: 10480.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.
Автор: Francis Leonard Deepak; Alvaro Mayoral; Raul Arena Название: Advanced Transmission Electron Microscopy ISBN: 3319151762 ISBN-13(EAN): 9783319151762 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials.
Автор: Sun Название: In-Situ Transmission Electron Microscopy ISBN: 9811968446 ISBN-13(EAN): 9789811968440 Издательство: Springer Рейтинг: Цена: 22359.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.
Описание: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.
Автор: Hiroyasu Saka Название: Practical Electron Microscopy Of Lattice Defects ISBN: 9811234698 ISBN-13(EAN): 9789811234699 Издательство: World Scientific Publishing Рейтинг: Цена: 15840.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: 'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]
Ultramicroscopy
This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Автор: Page Lisa Название: Handbook of Transmission Electron Microscopy ISBN: 1632382830 ISBN-13(EAN): 9781632382832 Издательство: Неизвестно Цена: 28506.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Keyse, Dr Robert Название: Introduction to Scanning Transmission Electron Microscopy ISBN: 1859960669 ISBN-13(EAN): 9781859960660 Издательство: Taylor&Francis Рейтинг: Цена: 12248.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Cavalier, Annie Название: Handbook of Cryo-Preparation Methods for Electron Microscopy ISBN: 0849372275 ISBN-13(EAN): 9780849372278 Издательство: Taylor&Francis Рейтинг: Цена: 39811.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
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