Handbook of Cryo-Preparation Methods for Electron Microscopy, Cavalier, Annie
Автор: Zewail, Ahmed H. Thomas, John M. Название: 4d electron microscopy ISBN: 1848163908 ISBN-13(EAN): 9781848163904 Издательство: World Scientific Publishing Рейтинг: Цена: 12751.00 р. 18216.00-30% Наличие на складе: Есть (2 шт.) Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.
Автор: Hiroyasu Saka Название: Practical Electron Microscopy Of Lattice Defects ISBN: 9811234698 ISBN-13(EAN): 9789811234699 Издательство: World Scientific Publishing Рейтинг: Цена: 15840.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: 'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]
Ultramicroscopy
This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Автор: Thomas Vogt; Wolfgang Dahmen; Peter Binev Название: Modeling Nanoscale Imaging in Electron Microscopy ISBN: 1489997288 ISBN-13(EAN): 9781489997289 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Автор: Kenichi Shimizu; Tomoaki Mitani Название: New Horizons of Applied Scanning Electron Microscopy ISBN: 364226168X ISBN-13(EAN): 9783642261688 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.
Автор: Kenichi Shimizu; Tomoaki Mitani Название: New Horizons of Applied Scanning Electron Microscopy ISBN: 3642031595 ISBN-13(EAN): 9783642031595 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.
Автор: Bonnell Dawn A Название: Scanning Probe Microscopy for Energy Research ISBN: 9814434701 ISBN-13(EAN): 9789814434706 Издательство: World Scientific Publishing Рейтинг: Цена: 31680.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
Описание: * Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations * Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer.
Описание: Describes the instruments, samples, protocols, and analyses that belong to cryo-EM. This title emphasizes the relatedness of the ideas, instrumentation, and methods underlying cryo-EM approaches which allow practitioners to easily move between them.
Автор: Jensen, Grant Название: Cryo-Em Part B: 3-D Reconstruction,482 ISBN: 0123849918 ISBN-13(EAN): 9780123849915 Издательство: Elsevier Science Рейтинг: Цена: 24423.00 р. Наличие на складе: Нет в наличии.
Описание: Deals with a description of the instruments, samples, protocols, and analyses that belong to cryo-EM. This title emphasizes the relatedness of the ideas, instrumentation, and methods underlying all cryo-EM approaches which allow practictioners to easily move between them.
Автор: Jensen, Grant Название: Cryo-Em, Part C,483 ISBN: 0123849934 ISBN-13(EAN): 9780123849939 Издательство: Elsevier Science Рейтинг: Цена: 24423.00 р. Наличие на складе: Нет в наличии.
Описание: Describes the instruments, samples, protocols, and analyses that belong to cryo-EM. This title emphasizes the relatedness of the ideas, instrumentation, and methods underlying various cryo-EM approaches which allow practitioners to easily move between them.
Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
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