Handbook of Cryo-Preparation Methods for Electron Microscopy, Cavalier, Annie

Автор: Zewail, Ahmed H. Thomas, John M.
Название: 4d electron microscopy
ISBN: 1848163908 ISBN-13(EAN): 9781848163904
Издательство: World Scientific Publishing
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Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.

Автор: Barabash Rozaliya, Ice Gene
Название: Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects
ISBN: 1908979623 ISBN-13(EAN): 9781908979629
Издательство: World Scientific Publishing
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Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.

Автор: Bonnell Dawn A
Название: Scanning Probe Microscopy for Energy Research
ISBN: 9814434701 ISBN-13(EAN): 9789814434706
Издательство: World Scientific Publishing
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Цена: 31680.00 р.
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Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Автор: Jensen, Grant
Название: Cryo-Em Part A: Sample Preparation And Data Collection,481
ISBN: 0123749069 ISBN-13(EAN): 9780123749062
Издательство: Elsevier Science
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Описание: Describes the instruments, samples, protocols, and analyses that belong to cryo-EM. This title emphasizes the relatedness of the ideas, instrumentation, and methods underlying cryo-EM approaches which allow practitioners to easily move between them.

Автор: Jensen, Grant
Название: Cryo-Em Part B: 3-D Reconstruction,482
ISBN: 0123849918 ISBN-13(EAN): 9780123849915
Издательство: Elsevier Science
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Описание: Deals with a description of the instruments, samples, protocols, and analyses that belong to cryo-EM. This title emphasizes the relatedness of the ideas, instrumentation, and methods underlying all cryo-EM approaches which allow practictioners to easily move between them.

Автор: Jensen, Grant
Название: Cryo-Em, Part C,483
ISBN: 0123849934 ISBN-13(EAN): 9780123849939
Издательство: Elsevier Science
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Описание: Describes the instruments, samples, protocols, and analyses that belong to cryo-EM. This title emphasizes the relatedness of the ideas, instrumentation, and methods underlying various cryo-EM approaches which allow practitioners to easily move between them.

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 14673.00 р.
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Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Автор: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil;
Название: Sample Preparation Handbook for Transmission Electron Microscopy
ISBN: 1489998853 ISBN-13(EAN): 9781489998859
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis.

Автор: David G. Robinson; David G. Robinson; K. M?hlethal
Название: Methods of Preparation for Electron Microscopy
ISBN: 354017592X ISBN-13(EAN): 9783540175926
Издательство: Springer
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Цена: 15672.00 р.
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Описание: Many competent biological and medical research workers expressed their anxiety that objects in high vacuum would be modified due to complete dehydration and the absorbed electron energy would eventually cause degrada- tion to rudimentary carbon backbones.

Автор: Goodhew, PJ
Название: Specimen Preparation for Transmission Electron Microscopy of Materials
ISBN: 0198564031 ISBN-13(EAN): 9780198564034
Издательство: Taylor&Francis
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Автор: Kuo John
Название: Electron Microscopy
ISBN: 1627037756 ISBN-13(EAN): 9781627037754
Издательство: Springer
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Цена: 34937.00 р.
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Описание:

1. Conventional Specimen Preparation Techniques For Transmission Electron Microscopy of Cultured Cells

John J. Bozzola

2. Microwave-assisted Processing and Embedding for Transmission Electron Microscopy

Paul Webster

30. Freeze Stabilization and Cryopreparation Technique for Visualizing the Water Distribution in Woody Tissues by X-ray Im

Автор: Thomas Mueller-Reichert
Название: Correlative Light and Electron MIcroscopy,111
ISBN: 0124160263 ISBN-13(EAN): 9780124160262
Издательство: Elsevier Science
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Описание: Covers areas of CLEM including a brief history and overview on CLEM methods, imaging of intermediate stages of meiotic spindle assembly in C. This title includes a brief history and overview on CLEM methods.